Spatial resolution and radiation damage in quantitative high-resolution STEM-EEL spectroscopy in oxides

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Keywords

@article{5b6805e7e2fe4000b553ae02de2c6c42,

title = "Spatial resolution and radiation damage in quantitative high-resolution STEM-EEL spectroscopy in oxides",

keywords = "n/a OA procedure",

author = "L. Houben and M. Heidelmann and F. Gunkel",

year = "2012",

doi = "10.1016/j.micron.2011.10.006",

language = "English",

volume = "43",

pages = "532--537",

journal = "Micron",

issn = "0968-4328",

publisher = "Elsevier",

number = "4",

}

TY - JOUR

T1 - Spatial resolution and radiation damage in quantitative high-resolution STEM-EEL spectroscopy in oxides

AU - Houben, L.

AU - Heidelmann, M.

AU - Gunkel, F.

PY - 2012

Y1 - 2012

KW - n/a OA procedure

U2 - 10.1016/j.micron.2011.10.006

DO - 10.1016/j.micron.2011.10.006

M3 - Article

SN - 0968-4328

VL - 43

SP - 532

EP - 537

JO - Micron

JF - Micron

IS - 4

ER -