Special Section on the 2008 International Conference on Microelectronic Test Structure

Jurriaan  Schmitz

doi:10.1109/TSM.2008.2010725

Special Section on the 2008 International Conference on Microelectronic Test Structure

Jurriaan Schmitz

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Abstract

The 13 papers in this special section were originally presented at the 2008 International Conference on Microelectronic Test Structures (ICMTS), held in Edinburgh, UK.

Original language	English
Pages (from-to)	50-50
Number of pages	1
Journal	IEEE Transactions on Semiconductor Manufacturing
Volume	22
Issue number	1
DOIs	https://doi.org/10.1109/TSM.2008.2010725
Publication status	Published - 3 Feb 2009
Event	21st IEEE International Conference on Microelectronic Test Structures, ICMTS 2008 - University of Edinburgh, Edinburgh, United Kingdom Duration: 24 Mar 2008 → 27 Mar 2008 Conference number: 21 http://www.homepages.ed.ac.uk/ajw/ICMTS/prog08.pdf

Keywords

EWI-15296
METIS-263819
IR-65467

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10.1109/TSM.2008.2010725

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title = "Special Section on the 2008 International Conference on Microelectronic Test Structure",

abstract = "The 13 papers in this special section were originally presented at the 2008 International Conference on Microelectronic Test Structures (ICMTS), held in Edinburgh, UK.",

keywords = "EWI-15296, METIS-263819, IR-65467",

author = "Jurriaan Schmitz",

year = "2009",

month = feb,

day = "3",

doi = "10.1109/TSM.2008.2010725",

language = "English",

volume = "22",

pages = "50--50",

journal = "IEEE Transactions on Semiconductor Manufacturing",

issn = "0894-6507",

publisher = "IEEE",

number = "1",

note = "21st IEEE International Conference on Microelectronic Test Structures, ICMTS 2008, ICMTS ; Conference date: 24-03-2008 Through 27-03-2008",

url = "http://www.homepages.ed.ac.uk/ajw/ICMTS/prog08.pdf",

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AB - The 13 papers in this special section were originally presented at the 2008 International Conference on Microelectronic Test Structures (ICMTS), held in Edinburgh, UK.

KW - EWI-15296

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KW - IR-65467

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DO - 10.1109/TSM.2008.2010725

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JO - IEEE Transactions on Semiconductor Manufacturing

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IS - 1

T2 - 21st IEEE International Conference on Microelectronic Test Structures, ICMTS 2008

Y2 - 24 March 2008 through 27 March 2008

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Special Section on the 2008 International Conference on Microelectronic Test Structure

Abstract

Keywords

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