Special Section on the 2008 International Conference on Microelectronic Test Structure

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Abstract

The 13 papers in this special section were originally presented at the 2008 International Conference on Microelectronic Test Structures (ICMTS), held in Edinburgh, UK.
Original languageEnglish
Pages (from-to)50-50
Number of pages1
JournalIEEE Transactions on Semiconductor Manufacturing
Volume22
Issue number1
DOIs
Publication statusPublished - 3 Feb 2009
Event21st IEEE International Conference on Microelectronic Test Structures, ICMTS 2008 - University of Edinburgh, Edinburgh, United Kingdom
Duration: 24 Mar 200827 Mar 2008
Conference number: 21
http://www.homepages.ed.ac.uk/ajw/ICMTS/prog08.pdf

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microelectronics
Microelectronics

Keywords

  • EWI-15296
  • METIS-263819
  • IR-65467

Cite this

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title = "Special Section on the 2008 International Conference on Microelectronic Test Structure",
abstract = "The 13 papers in this special section were originally presented at the 2008 International Conference on Microelectronic Test Structures (ICMTS), held in Edinburgh, UK.",
keywords = "EWI-15296, METIS-263819, IR-65467",
author = "Jurriaan Schmitz",
year = "2009",
month = "2",
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doi = "10.1109/TSM.2008.2010725",
language = "English",
volume = "22",
pages = "50--50",
journal = "IEEE transactions on semiconductor manufacturing",
issn = "0894-6507",
publisher = "IEEE",
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}

Special Section on the 2008 International Conference on Microelectronic Test Structure. / Schmitz, Jurriaan .

In: IEEE Transactions on Semiconductor Manufacturing, Vol. 22, No. 1, 03.02.2009, p. 50-50.

Research output: Contribution to journalArticleAcademic

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JF - IEEE transactions on semiconductor manufacturing

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