Specific Contact Resistance Measurements of Metal-Semiconductor Junctions

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

    Original languageUndefined
    Title of host publicationProceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005
    Place of PublicationVeldhoven, The Netherlands
    PublisherSTW
    Pages52-55
    Number of pages4
    ISBN (Print)90-73461-50-2
    Publication statusPublished - 17 Nov 2005
    Event8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2005 - Veldhoven, Netherlands
    Duration: 17 Nov 200518 Nov 2005
    Conference number: 8

    Workshop

    Workshop8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2005
    Abbreviated titleSAFE
    CountryNetherlands
    CityVeldhoven
    Period17/11/0518/11/05

    Keywords

    • METIS-225625

    Cite this

    Stavitski, N., van Dal, M. J. H., Wolters, R. A. M., Kovalgin, A. Y., & Schmitz, J. (2005). Specific Contact Resistance Measurements of Metal-Semiconductor Junctions. In Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005 (pp. 52-55). Veldhoven, The Netherlands: STW.