Specific Contact Resistance Measurements of Metal-Semiconductor Junctions

N. Stavitski; M.J.H. van Dal; Robertus A.M. Wolters; Alexeij Y. Kovalgin; Jurriaan Schmitz

Specific Contact Resistance Measurements of Metal-Semiconductor Junctions

N. Stavitski, M.J.H. van Dal, Robertus A.M. Wolters, Alexeij Y. Kovalgin, Jurriaan Schmitz

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

Original language	Undefined
Title of host publication	Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005
Place of Publication	Veldhoven, The Netherlands
Publisher	STW
Pages	52-55
Number of pages	4
ISBN (Print)	90-73461-50-2
Publication status	Published - 17 Nov 2005
Event	8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2005 - Veldhoven, Netherlands Duration: 17 Nov 2005 → 18 Nov 2005 Conference number: 8

Workshop

Workshop	8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2005
Abbreviated title	SAFE
Country/Territory	Netherlands
City	Veldhoven
Period	17/11/05 → 18/11/05

Keywords

METIS-225625

Cite this

@inproceedings{98b34feb7c7a4596b99628e8f1b163e4,

title = "Specific Contact Resistance Measurements of Metal-Semiconductor Junctions",

keywords = "METIS-225625",

author = "N. Stavitski and {van Dal}, M.J.H. and Wolters, {Robertus A.M.} and Kovalgin, {Alexeij Y.} and Jurriaan Schmitz",

year = "2005",

month = nov,

day = "17",

language = "Undefined",

isbn = "90-73461-50-2",

pages = "52--55",

booktitle = "Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005",

publisher = "STW",

note = "8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2005 ; Conference date: 17-11-2005 Through 18-11-2005",

}

Stavitski, N, van Dal, MJH, Wolters, RAM, Kovalgin, AY & Schmitz, J 2005, Specific Contact Resistance Measurements of Metal-Semiconductor Junctions. in Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. STW, Veldhoven, The Netherlands, pp. 52-55, 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2005, Veldhoven, Netherlands, 17/11/05.

Specific Contact Resistance Measurements of Metal-Semiconductor Junctions. / Stavitski, N.; van Dal, M.J.H.; Wolters, Robertus A.M. et al.
Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, 2005. p. 52-55.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

TY - GEN

T1 - Specific Contact Resistance Measurements of Metal-Semiconductor Junctions

AU - Stavitski, N.

AU - van Dal, M.J.H.

AU - Wolters, Robertus A.M.

AU - Kovalgin, Alexeij Y.

AU - Schmitz, Jurriaan

N1 - Conference code: 8

PY - 2005/11/17

Y1 - 2005/11/17

KW - METIS-225625

M3 - Conference contribution

SN - 90-73461-50-2

SP - 52

EP - 55

BT - Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005

PB - STW

CY - Veldhoven, The Netherlands

T2 - 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2005

Y2 - 17 November 2005 through 18 November 2005

ER -