Specification driven test pattern generation for mixed-signal devices

K.W. Scheppink, Hans G. Kerkhoff

    Research output: Contribution to conferencePoster

    Original languageUndefined
    Pages-
    Publication statusPublished - 30 Jun 1994
    EventMESA Dag 1994 - Best Western Dish Hotel, Enschede, Netherlands
    Duration: 30 Jun 199430 Jun 1994

    Conference

    ConferenceMESA Dag 1994
    CountryNetherlands
    CityEnschede
    Period30/06/9430/06/94
    Other(MESA Day/Meeting)

    Keywords

    • METIS-114814

    Cite this

    Scheppink, K. W., & Kerkhoff, H. G. (1994). Specification driven test pattern generation for mixed-signal devices. -. Poster session presented at MESA Dag 1994, Enschede, Netherlands.