Spectral domain optical coherence tomography imaging with an integrated optics spectrometer

V. Duc Nguyen; B.I. Akça; Kerstin Worhoff; R.M. de Ridder; Markus Pollnau; Ton van Leeuwen; Jeroen Kalkman

doi:10.1364/OL.36.001293

Spectral domain optical coherence tomography imaging with an integrated optics spectrometer

V. Duc Nguyen, B.I. Akça, Kerstin Worhoff, R.M. de Ridder, Markus Pollnau, Ton van Leeuwen, Jeroen Kalkman

Biomedical Photonic Imaging

Research output: Contribution to journal › Article › Academic › peer-review

51 Citations (Scopus)

Abstract

We designed and fabricated an arrayed-waveguide grating (AWG) in silicon oxynitride as a spectrometer for spectral domain optical coherence tomography (SD-OCT). The AWG has a footprint of only 3.0 cm×2.5 cm, operates at a center wavelength of 1300 nm, and has 78 nm free spectral range. OCT measurements are performed that demonstrate imaging up to a maximum depth of 1 mm with an axial resolution of 19 μm, both in agreement with the AWG design parameters. Using the AWG spectrometer combined with a fiber-based SD-OCT system, we demonstrate cross-sectional OCT imaging of a multilayered scattering phantom.

Original language	Undefined
Pages (from-to)	1293-1295
Number of pages	3
Journal	Optics letters
Volume	36
Issue number	7
DOIs	https://doi.org/10.1364/OL.36.001293
Publication status	Published - Apr 2011

Keywords

IOMS-APD: Active Photonic Devices
IR-76546
METIS-279147
EWI-19920

Access to Document

10.1364/OL.36.001293

http://eprints.eemcs.utwente.nl/secure2/19920/01/099-ol18_Nguyen.pdf

Cite this

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AU - Nguyen, V. Duc

AU - Akça, B.I.

AU - Worhoff, Kerstin

AU - de Ridder, R.M.

AU - Pollnau, Markus

AU - van Leeuwen, Ton

AU - Kalkman, Jeroen

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AB - We designed and fabricated an arrayed-waveguide grating (AWG) in silicon oxynitride as a spectrometer for spectral domain optical coherence tomography (SD-OCT). The AWG has a footprint of only 3.0 cm×2.5 cm, operates at a center wavelength of 1300 nm, and has 78 nm free spectral range. OCT measurements are performed that demonstrate imaging up to a maximum depth of 1 mm with an axial resolution of 19 μm, both in agreement with the AWG design parameters. Using the AWG spectrometer combined with a fiber-based SD-OCT system, we demonstrate cross-sectional OCT imaging of a multilayered scattering phantom.

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