Spectroscopic ellipsometry for H diffusion

Research output: Contribution to conferencePosterOther research output

Original languageEnglish
Pages-
Publication statusPublished - 3 Apr 2016
EventSPIE Photonics Europe 2016 - SQUARE Brussels Meeting Centre, Brussels, Belgium
Duration: 3 Apr 20167 Apr 2016
https://spie.org/conferences-and-exhibitions/past-conferences-and-exhibitions/photonics-europe-2016

Conference

ConferenceSPIE Photonics Europe 2016
CountryBelgium
CityBrussels
Period3/04/167/04/16
Internet address

Keywords

  • METIS-316369

Cite this

Soroka, O., Jose, A. A., van de Kruijs, R. W. E., Bijkerk, F., & Lee, C. J. (2016). Spectroscopic ellipsometry for H diffusion. -. Poster session presented at SPIE Photonics Europe 2016, Brussels, Belgium.
Soroka, Olena ; Jose, A.A. ; van de Kruijs, Robbert Wilhelmus Elisabeth ; Bijkerk, Frederik ; Lee, Christopher James. / Spectroscopic ellipsometry for H diffusion. Poster session presented at SPIE Photonics Europe 2016, Brussels, Belgium.
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title = "Spectroscopic ellipsometry for H diffusion",
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author = "Olena Soroka and A.A. Jose and {van de Kruijs}, {Robbert Wilhelmus Elisabeth} and Frederik Bijkerk and Lee, {Christopher James}",
year = "2016",
month = "4",
day = "3",
language = "English",
pages = "--",
note = "SPIE Photonics Europe 2016 ; Conference date: 03-04-2016 Through 07-04-2016",
url = "https://spie.org/conferences-and-exhibitions/past-conferences-and-exhibitions/photonics-europe-2016",

}

Soroka, O, Jose, AA, van de Kruijs, RWE, Bijkerk, F & Lee, CJ 2016, 'Spectroscopic ellipsometry for H diffusion' SPIE Photonics Europe 2016, Brussels, Belgium, 3/04/16 - 7/04/16, pp. -.

Spectroscopic ellipsometry for H diffusion. / Soroka, Olena; Jose, A.A.; van de Kruijs, Robbert Wilhelmus Elisabeth; Bijkerk, Frederik; Lee, Christopher James.

2016. - Poster session presented at SPIE Photonics Europe 2016, Brussels, Belgium.

Research output: Contribution to conferencePosterOther research output

TY - CONF

T1 - Spectroscopic ellipsometry for H diffusion

AU - Soroka, Olena

AU - Jose, A.A.

AU - van de Kruijs, Robbert Wilhelmus Elisabeth

AU - Bijkerk, Frederik

AU - Lee, Christopher James

PY - 2016/4/3

Y1 - 2016/4/3

KW - METIS-316369

M3 - Poster

SP - -

ER -

Soroka O, Jose AA, van de Kruijs RWE, Bijkerk F, Lee CJ. Spectroscopic ellipsometry for H diffusion. 2016. Poster session presented at SPIE Photonics Europe 2016, Brussels, Belgium.