Specular reflection intensity modulated by grazing-incidence diffraction in a wide angular range

K. V. Nikolaev*, I. A. Makhotkin, S. N. Yakunin, R. W.E. Van De Kruijs, M. A. Chuev, F. Bijkerk

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

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Abstract

Grazing-incidence X-ray diffraction (GID) is a well known technique for the characterization of crystal surfaces. A theoretical study has been performed of the sensitivity of GID to the structure of a crystal surface and distorted nanometre-thin surface layers. To simulate GID from crystals that have a complex subsurface structure, a matrix formalism of the dynamical diffraction theory has been applied. It has been found that the azimuthal rocking curves of a crystal that has a distorted subsurface, measured over a wide angular range, show asymmetric thickness oscillations with two distinguishable sets of frequencies: one corresponding to the diffraction in the single-crystal subsurface layer and the second corresponding to the diffraction in the single-crystal substrate. Therefore, azimuthal rocking curves allow characterization of the subsurface structure of a single crystal. Furthermore, thickness oscillations induced by evanescent diffraction modulate the specular reflection intensity, showing high-intensity modulations. This will potentially allow implementation of subsurface crystal characterization using, for instance, a laboratory-scale X-ray diffractometer.

Original languageEnglish
Pages (from-to)545-552
Number of pages8
JournalActa Crystallographica Section A: Foundations and Advances
Volume74
Issue number5
DOIs
Publication statusPublished - 1 Sep 2018

Keywords

  • UT-Hybrid-D
  • Crystal surface
  • GID
  • Grazing-incidence X-ray diffraction
  • Specular reflection
  • Azimuthal rocking curves

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