Spot size characterization of focused non-Gaussian beams

J. Chalupský, J. Krzywinski, L. Juha, V. Hájková, J. Cihelka, T. Burian, L. Vyšín, J. Gaudin, A.J. Gleeson, M. Jurek, A.R. Khorsand, D. Klinger, H. Wabnitz, R. Sobierajski, M. Störmer, K. Tiedtke, S. Toleikis

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We present a new technique for the analysis of non-Gaussian laser beams which can not be described by an analytical formula. As a generalization of the beam spot area we apply and extend the definition of so called effective area (Aeff) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which might be misleading for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft x-ray free electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination and their further utilization are presented in this paper
Original languageEnglish
Pages (from-to)27836-27845
JournalOptics express
Issue number26
Publication statusPublished - 2010


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