Spot size characterization of focused non-Gaussian beams

J. Chalupský; J. Krzywinski; L. Juha; V. Hájková; J. Cihelka; T. Burian; L. Vyšín; J. Gaudin; A.J. Gleeson; M. Jurek; A.R. Khorsand; D. Klinger; H. Wabnitz; R. Sobierajski; M. Störmer; K. Tiedtke; S. Toleikis

doi:10.1364/OE.18.027836

Spot size characterization of focused non-Gaussian beams

J. Chalupský, J. Krzywinski, L. Juha, V. Hájková, J. Cihelka, T. Burian, L. Vyšín, J. Gaudin, A.J. Gleeson, M. Jurek, A.R. Khorsand, D. Klinger, H. Wabnitz, R. Sobierajski, M. Störmer, K. Tiedtke, S. Toleikis

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Abstract

We present a new technique for the analysis of non-Gaussian laser beams which can not be described by an analytical formula. As a generalization of the beam spot area we apply and extend the definition of so called effective area (Aeff) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which might be misleading for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft x-ray free electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination and their further utilization are presented in this paper

Original language	English
Pages (from-to)	27836-27845
Journal	Optics express
Volume	18
Issue number	26
DOIs	https://doi.org/10.1364/OE.18.027836
Publication status	Published - 2010

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Chalupský, J., Krzywinski, J., Juha, L., Hájková, V., Cihelka, J., Burian, T., Vyšín, L., Gaudin, J., Gleeson, A. J., Jurek, M., Khorsand, A. R., Klinger, D., Wabnitz, H., Sobierajski, R., Störmer, M., Tiedtke, K., & Toleikis, S. (2010). Spot size characterization of focused non-Gaussian beams. Optics express, 18(26), 27836-27845. https://doi.org/10.1364/OE.18.027836

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title = "Spot size characterization of focused non-Gaussian beams",

abstract = "We present a new technique for the analysis of non-Gaussian laser beams which can not be described by an analytical formula. As a generalization of the beam spot area we apply and extend the definition of so called effective area (Aeff) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which might be misleading for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft x-ray free electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination and their further utilization are presented in this paper",

author = "J. Chalupsk{\'y} and J. Krzywinski and L. Juha and V. H{\'a}jkov{\'a} and J. Cihelka and T. Burian and L. Vy{\v s}{\'i}n and J. Gaudin and A.J. Gleeson and M. Jurek and A.R. Khorsand and D. Klinger and H. Wabnitz and R. Sobierajski and M. St{\"o}rmer and K. Tiedtke and S. Toleikis",

year = "2010",

doi = "10.1364/OE.18.027836",

language = "English",

volume = "18",

pages = "27836--27845",

journal = "Optics express",

issn = "1094-4087",

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TY - JOUR

T1 - Spot size characterization of focused non-Gaussian beams

AU - Chalupský, J.

AU - Krzywinski, J.

AU - Juha, L.

AU - Hájková, V.

AU - Cihelka, J.

AU - Burian, T.

AU - Vyšín, L.

AU - Gaudin, J.

AU - Gleeson, A.J.

AU - Jurek, M.

AU - Khorsand, A.R.

AU - Klinger, D.

AU - Wabnitz, H.

AU - Sobierajski, R.

AU - Störmer, M.

AU - Tiedtke, K.

AU - Toleikis, S.

PY - 2010

Y1 - 2010

N2 - We present a new technique for the analysis of non-Gaussian laser beams which can not be described by an analytical formula. As a generalization of the beam spot area we apply and extend the definition of so called effective area (Aeff) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which might be misleading for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft x-ray free electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination and their further utilization are presented in this paper

AB - We present a new technique for the analysis of non-Gaussian laser beams which can not be described by an analytical formula. As a generalization of the beam spot area we apply and extend the definition of so called effective area (Aeff) [1] in order to avoid using the full-width at half maximum (FWHM) parameter which might be misleading for non-Gaussian beams. Furthermore, we demonstrate a practical utilization of our technique for a femtosecond soft x-ray free electron laser. The ablative imprints in poly(methyl methacrylate) - PMMA and amorphous carbon (a-C) are used to characterize the spatial beam profile and to determine the effective area. Two procedures of the effective area determination and their further utilization are presented in this paper

U2 - 10.1364/OE.18.027836

DO - 10.1364/OE.18.027836

M3 - Article

VL - 18

SP - 27836

EP - 27845

JO - Optics express

JF - Optics express

SN - 1094-4087

IS - 26

ER -

Spot size characterization of focused non-Gaussian beams

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