Stability of indium tin oxide/polymer interfaces

X. Crispin; A. Crispin; M. P. De Jong; S. Marciniak; W. Osikowicz; S. Jönsson; M. Fahlman; Th Kugler; L. J. Van Ijzendoorn; M. J.A. De Voigt; W. R. Salaneck

doi:10.1021/acsami.2c13312

Stability of indium tin oxide/polymer interfaces

X. Crispin^*
, A. Crispin
, M. P. De Jong
, S. Marciniak
, W. Osikowicz
, S. Jönsson
, M. Fahlman
, Th Kugler
, L. J. Van Ijzendoorn
, M. J.A. De Voigt
, W. R. Salaneck

^*Corresponding author for this work

Research output: Contribution to journal › Conference article › Academic › peer-review

1 Citation (Scopus)

Abstract

Interfacial chemistry at indium tin oxide/polymer interfaces is of fundamental importance for the performance of polymer-based light emitting diodes. X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry are used to investigate the stability of the interface formed between indium tin oxide and (i) the light emitting polymer poly(p-phenylenevinylene), and (ii) the hole injecting layer poly(3,4-ethylenedioxythiophene) polystyrenesulfonate. The formed interfaces are not stable and indium-containing species diffuse from the metal oxide surface into the polymer layers.

Original language	English
Pages (from-to)	315-326
Number of pages	12
Journal	Materials Research Society Symposium - Proceedings
Volume	747
DOIs	https://doi.org/10.1021/acsami.2c13312
Publication status	Published - 2003
Externally published	Yes
Event	Crystalline Oxide-Silicon Heterostructures and Oxide Optoelectronics 2002 - Boston, MA, United States Duration: 2 Dec 2002 → 4 Dec 2002

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n/a OA procedure

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10.1021/acsami.2c13312

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@article{4b5fa7e55bee4c63b7af0633e71f5120,

title = "Stability of indium tin oxide/polymer interfaces",

abstract = "Interfacial chemistry at indium tin oxide/polymer interfaces is of fundamental importance for the performance of polymer-based light emitting diodes. X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry are used to investigate the stability of the interface formed between indium tin oxide and (i) the light emitting polymer poly(p-phenylenevinylene), and (ii) the hole injecting layer poly(3,4-ethylenedioxythiophene) polystyrenesulfonate. The formed interfaces are not stable and indium-containing species diffuse from the metal oxide surface into the polymer layers.",

keywords = "n/a OA procedure",

author = "X. Crispin and A. Crispin and \{De Jong\}, \{M. P.\} and S. Marciniak and W. Osikowicz and S. J{\"o}nsson and M. Fahlman and Th Kugler and \{Van Ijzendoorn\}, \{L. J.\} and \{De Voigt\}, \{M. J.A.\} and Salaneck, \{W. R.\}",

year = "2003",

doi = "10.1021/acsami.2c13312",

language = "English",

volume = "747",

pages = "315--326",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

note = "Crystalline Oxide-Silicon Heterostructures and Oxide Optoelectronics 2002 ; Conference date: 02-12-2002 Through 04-12-2002",

}

TY - JOUR

T1 - Stability of indium tin oxide/polymer interfaces

AU - Crispin, X.

AU - Crispin, A.

AU - De Jong, M. P.

AU - Marciniak, S.

AU - Osikowicz, W.

AU - Jönsson, S.

AU - Fahlman, M.

AU - Kugler, Th

AU - Van Ijzendoorn, L. J.

AU - De Voigt, M. J.A.

AU - Salaneck, W. R.

PY - 2003

Y1 - 2003

N2 - Interfacial chemistry at indium tin oxide/polymer interfaces is of fundamental importance for the performance of polymer-based light emitting diodes. X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry are used to investigate the stability of the interface formed between indium tin oxide and (i) the light emitting polymer poly(p-phenylenevinylene), and (ii) the hole injecting layer poly(3,4-ethylenedioxythiophene) polystyrenesulfonate. The formed interfaces are not stable and indium-containing species diffuse from the metal oxide surface into the polymer layers.

AB - Interfacial chemistry at indium tin oxide/polymer interfaces is of fundamental importance for the performance of polymer-based light emitting diodes. X-ray photoelectron spectroscopy and Rutherford backscattering spectrometry are used to investigate the stability of the interface formed between indium tin oxide and (i) the light emitting polymer poly(p-phenylenevinylene), and (ii) the hole injecting layer poly(3,4-ethylenedioxythiophene) polystyrenesulfonate. The formed interfaces are not stable and indium-containing species diffuse from the metal oxide surface into the polymer layers.

KW - n/a OA procedure

UR - https://www.scopus.com/pages/publications/0043064051

U2 - 10.1021/acsami.2c13312

DO - 10.1021/acsami.2c13312

M3 - Conference article

AN - SCOPUS:0043064051

SN - 0272-9172

VL - 747

SP - 315

EP - 326

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Crystalline Oxide-Silicon Heterostructures and Oxide Optoelectronics 2002

Y2 - 2 December 2002 through 4 December 2002

ER -

Stability of indium tin oxide/polymer interfaces

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