We have developed a stand-along atomic force microscope featuring large scan, friction measurement, atomic resolution and capability of in liquid operation. Cantilever displacements are detected with optical beam deflection. Cantilever and laser diode are both attached at the piezo tube and thus scanned simultaneously. As a direct consequence the maximum scan range, 25 X 25 micrometers 2, is solely determined by the characteristics of the piezo tube and not by the dimensions of the cantilever and/or the waist of the laser beam. The stand- along atomic force microscope is suitable to be combined with any inverted optical microscope (including the confocal laser scanning microscope), as is illustrated with fluorescence and height images of K562-cells. Results on thin films consisting of a mixture of polymers show the strength of measuring friction and height simultaneously. Images of mica show that atomic resolution can be obtained both in height and friction mode.
|Title of host publication||Scanning Probe Microscopies II|
|Subtitle of host publication||OE/LASE'93: Optics, Electro-Optics, and Laser Applications in Scienceand Engineering, 1993, Los Angeles, CA, United States|
|Editors||Clayton C. Williams|
|Publisher||SPIE - The International Society for Optical Engineering|
|Number of pages||7|
|Publication status||Published - 1 Jun 1993|
|Name||Proceedings of SPIE|