Stand-alone atomic force microscope featuring large scan, friction measurement, atomic resolution and capability of liquid operation

Constant A.J. Putman, Kees O. van der Werf, Bart G. de Grooth, Niek F. van Hulst, Jan Greve

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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Abstract

We have developed a stand-along atomic force microscope featuring large scan, friction measurement, atomic resolution and capability of in liquid operation. Cantilever displacements are detected with optical beam deflection. Cantilever and laser diode are both attached at the piezo tube and thus scanned simultaneously. As a direct consequence the maximum scan range, 25 X 25 micrometers 2, is solely determined by the characteristics of the piezo tube and not by the dimensions of the cantilever and/or the waist of the laser beam. The stand- along atomic force microscope is suitable to be combined with any inverted optical microscope (including the confocal laser scanning microscope), as is illustrated with fluorescence and height images of K562-cells. Results on thin films consisting of a mixture of polymers show the strength of measuring friction and height simultaneously. Images of mica show that atomic resolution can be obtained both in height and friction mode.
Original languageEnglish
Title of host publicationScanning Probe Microscopies II
Subtitle of host publicationOE/LASE'93: Optics, Electro-Optics, and Laser Applications in Scienceand Engineering, 1993, Los Angeles, CA, United States
EditorsClayton C. Williams
PublisherSPIE - The International Society for Optical Engineering
Pages202-208
Number of pages7
ISBN (Print)0-8194-1081-0
DOIs
Publication statusPublished - 1 Jun 1993

Publication series

NameProceedings of SPIE
PublisherSPIE
Volume1855

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