State-of-the-Art on Thermo-Mechanical Modelling of IC Back-End Processes

R.B.R. van Silfhout, A. de Boer, H.J.M. Geijselaers, Y. Li, J. Bisschop, F. Kuper, R.L. Schravendeel, J.H.J. Janssen, W.D. van Driel, G.Q. Zhang, M. Jansen

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProceedings of the 2nd International Conference on Benefiting from Thermal and Mechanical Simulation in (Micro)-Electronics (EuroSimE 2001)
Subtitle of host publication9-11 April 2001, Maison de la Chimie, Paris, France
EditorsQ.Q. Zhang
Place of PublicationParis
PublisherEuropia Productions
Pages277-289
ISBN (Print)0-7803-9806-8, 0-7803-9807-6 (CD)
Publication statusPublished - 9 Apr 2001
EventInternational Conference on Thermal, Mechanial and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, EurosimE 2001 - Paris, France
Duration: 9 Apr 200111 Apr 2001

Conference

ConferenceInternational Conference on Thermal, Mechanial and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, EurosimE 2001
Country/TerritoryFrance
CityParis
Period9/04/0111/04/01

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