Statistical breakdown measurement technique for monitoring diode-switch reliability in active matrix LCD production

S.J. Bijlsma, H. van Kranenburg, K. Nieuwesteeg, M.G. Pitt, J.F. Verweij

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the 25th European Solid State Device Research Conference, ESSDERC'95
    Place of PublicationThe Netherlands Congress Centre, The Hague
    Pages332-334
    Publication statusPublished - 25 Sep 1995

    Keywords

    • METIS-113985

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