Statistical breakdown measurement technique for monitoring diode-switch reliability in active matrix LCD production

S.J. Bijlsma, H. van Kranenburg, K. Nieuwesteeg, M.G. Pitt, J.F. Verweij

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the 25th European Solid State Device Research Conference, ESSDERC'95
Place of Publication	The Netherlands Congress Centre, The Hague
Pages	332-334
Publication status	Published - 25 Sept 1995

Keywords

@inproceedings{1f1aad43f7fb4233852bb17125aa023e,

title = "Statistical breakdown measurement technique for monitoring diode-switch reliability in active matrix LCD production",

keywords = "METIS-113985",

author = "S.J. Bijlsma and {van Kranenburg}, H. and K. Nieuwesteeg and M.G. Pitt and J.F. Verweij",

year = "1995",

month = sep,

day = "25",

language = "Undefined",

pages = "332--334",

booktitle = "Proceedings of the 25th European Solid State Device Research Conference, ESSDERC'95",

}

Statistical breakdown measurement technique for monitoring diode-switch reliability in active matrix LCD production. / Bijlsma, S.J.; van Kranenburg, H.; Nieuwesteeg, K. et al.
Proceedings of the 25th European Solid State Device Research Conference, ESSDERC'95. The Netherlands Congress Centre, The Hague, 1995. p. 332-334.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Statistical breakdown measurement technique for monitoring diode-switch reliability in active matrix LCD production

AU - Bijlsma, S.J.

AU - van Kranenburg, H.

AU - Nieuwesteeg, K.

AU - Pitt, M.G.

AU - Verweij, J.F.

PY - 1995/9/25

Y1 - 1995/9/25

KW - METIS-113985

M3 - Conference contribution

SP - 332

EP - 334

BT - Proceedings of the 25th European Solid State Device Research Conference, ESSDERC'95

CY - The Netherlands Congress Centre, The Hague

ER -