Statistical estimation in electron microscopy of the object wavefunction under weak scattering conditions using low-dose illumination from different directions

C.H. Slump; H.A. Ferwerda

doi:10.1080/713821493

Statistical estimation in electron microscopy of the object wavefunction under weak scattering conditions using low-dose illumination from different directions

C.H. Slump, H.A. Ferwerda

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Abstract

A statistically optimal (in the Cramer-Rao sense) reconstruction of the object wavefunction is presented. The analysis is based on low-dose images of weak phase-amplitude objects obtained by using parallel beams with four specific tilts. The full statistical characterization of the result is given.

Original language	English
Pages (from-to)	279-294
Number of pages	16
Journal	Optica Acta
Volume	31
Issue number	3
DOIs	https://doi.org/10.1080/713821493
Publication status	Published - 1 Jan 1984
Externally published	Yes

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Slump1984statisticalFinal published version, 680 KB

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title = "Statistical estimation in electron microscopy of the object wavefunction under weak scattering conditions using low-dose illumination from different directions",

abstract = "A statistically optimal (in the Cramer-Rao sense) reconstruction of the object wavefunction is presented. The analysis is based on low-dose images of weak phase-amplitude objects obtained by using parallel beams with four specific tilts. The full statistical characterization of the result is given.",

author = "C.H. Slump and H.A. Ferwerda",

year = "1984",

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Statistical estimation in electron microscopy of the object wavefunction under weak scattering conditions using low-dose illumination from different directions

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