Strain-induced structural changes in thin YBa2Cu3O7-x films on SrTiO3 substrates

V. Vonk, S.J. van Reeuwijk, Jan M. Dekkers, Sybolt Harkema, Augustinus J.H.M. Rijnders, H. Graafsma, H Graafsma

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Abstract

High-energy synchrotron radiation is used to obtain reciprocal space maps of thin YBa2Cu3O7−x films grown by pulsed laser deposition on (001) SrTiO3 substrates. The films show a transition from a tetragonal to an orthorhombic structure with increasing film thickness. The critical thickness is found to be 11.5±0.6 nm, whereas the thickness characterizing the tetragonal-to-orthorhombic transition is estimated to be 23±1 nm. Furthermore, it is shown that for miscut angles of the vicinal substrates up to approximately 1.2°, the films grow parallel to the optical surface-normal, rather than to the crystallographic c-axis of the substrates. The feasibility of using high energy X-rays allows for the use of complicated sample chambers, needed for in-situ studies of the growth and behaviour of thin films under controlled atmosphere and at elevated temperatures.
Original languageUndefined
Pages (from-to)133-137
Number of pages5
JournalThin solid films
Volume449
Issue number1,2
DOIs
Publication statusPublished - 2004

Keywords

  • Surface and interface states
  • METIS-218200
  • IR-75741
  • X-Ray diffraction
  • Epitaxy
  • Phase transitions

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