Stress development in thin yttrium films on hard substrates during hydrogen loading

M. Dornheim, A. Pundt, R. Kirchheim, S.J. van der Molen, Ernst S. Kooij, J.W.J. Kerssemakers, R. Griessen, H. Harms, U. Geyer

Research output: Contribution to journalArticleAcademicpeer-review

Original languageUndefined
Pages (from-to)8958-8965
Number of pages8
JournalJournal of Applied Physics
Volume93
Issue number11
Publication statusPublished - 2003

Keywords

  • METIS-214534

Cite this

Dornheim, M., Pundt, A., Kirchheim, R., van der Molen, S. J., Kooij, E. S., Kerssemakers, J. W. J., ... Geyer, U. (2003). Stress development in thin yttrium films on hard substrates during hydrogen loading. Journal of Applied Physics, 93(11), 8958-8965.