Stress-Induced Leakage Current in p+ Poly MOS Capacitors

V.E. Houtsma, J. Holleman, Cora Salm, F.P. Widdershoven, P.H. Woerlee

    Research output: Other contribution › Other research output

    Original languageUndefined
    Place of PublicationVeldhoven, the Netherlands
    Publication statusPublished - 15 Dec 1998

    Keywords

    • METIS-114887

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