Abstract
Contemporary silicon light-emitting diodes in silicon-on-insulator (SOI) technology suffer from poor efficiency compared to their bulk-silicon counterparts. In this letter, we present a new device structure where the carrier injection takes place through silicon slabs of only a few nanometer thick. Its external quantum efficiency of 1.4 • 10−4 at room temperature, with a spectrum peaking at 1130 nm, is almost two orders higher than reported thus far on SOI. The structure diminishes the dominant role of nonradiative recombination at the n+ and p+contacts, by confining the injected carriers in an SOI peninsula.
With this approach, a compact infrared light source can be fabricated using standard semiconductor processing steps.
| Original language | Undefined |
|---|---|
| Article number | 10.1109/LED.2007.895415 |
| Pages (from-to) | 383-385 |
| Number of pages | 3 |
| Journal | IEEE electron device letters |
| Volume | 28 |
| Issue number | WP07-01/5 |
| DOIs | |
| Publication status | Published - May 2007 |
Keywords
- EWI-9720
- IR-67077
- METIS-241602
- SC-SBLE: Silicon-based Light Emitters
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