Strong reduction of artifacts in AFM measurements by high frequency diode laser modulation

Kees van der Werf, R. Kassies, Martin L. Bennink, Vinod Subramaniam

    Research output: Contribution to conferencePoster

    Original languageEnglish
    Number of pages1
    Publication statusPublished - 2004
    EventDutch SPM Day 2004 - Free University, Amsterdam, Netherlands
    Duration: 5 Nov 20045 Nov 2004

    Conference

    ConferenceDutch SPM Day 2004
    Abbreviated titleDutch SPM Day 2004
    CountryNetherlands
    CityAmsterdam
    Period5/11/045/11/04

    Cite this

    van der Werf, K., Kassies, R., Bennink, M. L., & Subramaniam, V. (2004). Strong reduction of artifacts in AFM measurements by high frequency diode laser modulation. Poster session presented at Dutch SPM Day 2004, Amsterdam, Netherlands.