Strong reduction of artifacts in AFM measurements by high frequency diode laser modulation

Kees van der Werf, R. Kassies, Martin L. Bennink, Vinod Subramaniam

    Research output: Contribution to conferencePosterOther research output

    Original languageUndefined
    Pages-
    Publication statusPublished - 2004

    Keywords

    • METIS-222138

    Cite this

    @conference{2c5c9cd5e04c43639748632eb8490005,
    title = "Strong reduction of artifacts in AFM measurements by high frequency diode laser modulation",
    keywords = "METIS-222138",
    author = "{van der Werf}, Kees and R. Kassies and Bennink, {Martin L.} and Vinod Subramaniam",
    year = "2004",
    language = "Undefined",
    pages = "--",

    }

    Strong reduction of artifacts in AFM measurements by high frequency diode laser modulation. / van der Werf, Kees; Kassies, R.; Bennink, Martin L.; Subramaniam, Vinod.

    2004. -.

    Research output: Contribution to conferencePosterOther research output

    TY - CONF

    T1 - Strong reduction of artifacts in AFM measurements by high frequency diode laser modulation

    AU - van der Werf, Kees

    AU - Kassies, R.

    AU - Bennink, Martin L.

    AU - Subramaniam, Vinod

    PY - 2004

    Y1 - 2004

    KW - METIS-222138

    M3 - Poster

    SP - -

    ER -