Strong reduction of artifacts in AFM measurements by high frequency diode laser modulation

Research output: Contribution to conference › Poster › Other research output

Original language	English
Number of pages	1
Publication status	Published - 2004
Event	Dutch SPM Day 2004 - Free University, Amsterdam, Netherlands Duration: 5 Nov 2004 → 5 Nov 2004

Cite this

@conference{2c5c9cd5e04c43639748632eb8490005,

title = "Strong reduction of artifacts in AFM measurements by high frequency diode laser modulation",

author = "\{van der Werf\}, Kees and R. Kassies and Bennink, \{Martin L.\} and Vinod Subramaniam",

year = "2004",

language = "English",

note = "Dutch SPM Day 2004, Dutch SPM Day 2004 ; Conference date: 05-11-2004 Through 05-11-2004",

}