TY - JOUR
T1 - Structural and electrical properties of SnTe nanoflakes and nanowires
AU - Mientjes, Mathijs G.C.
AU - van Dijk, Lisanne M.
AU - Witmans, Femke J.
AU - Hendriks, Mika W.J.
AU - van de Sande, Vince
AU - Guan, Xin
AU - Kamphuis, Maarten J.G.
AU - Ridderbos, Joost
AU - Nichele, Fabrizio
AU - Verheijen, Marcel A.
AU - Brinkman, Alexander
AU - Zwanenburg, Floris A
AU - Bakkers, Erik P.A.M.
N1 - Publisher Copyright:
© 2025 The Author(s). Published by IOP Publishing Ltd.
PY - 2025/12/31
Y1 - 2025/12/31
N2 - SnTe is a topological crystalline insulator, hosting topologically non-trivial surface states with potential applications in fault-tolerant quantum computing. Nanowires, due to their high surface-to-volume ratio, offer an ideal geometry for measuring these states. However, distinction of conductance from these topological surface states from the trivial bulk is currently hindered by a high bulk carrier density. Due to the small dimensions of nanowires, accurate measurements of the carrier density in SnTe nanowires have been lacking. Here, we measure the carrier density in SnTe nanoflakes and nanowires using the Hall effect. We find that nanoflakes, which allow for easier device fabrication, exhibit carrier densities and mobilities comparable to those of nanowires grown under identical conditions. This suggests that nanoflakes can serve as reliable proxies for probing the electronic properties of nanowires. Additionally, we present a growth model explaining the formation mechanism of SnTe nanoflakes and nanowires. Together, these findings provide a foundation for systematic tuning of carrier density through growth parameter optimization.
AB - SnTe is a topological crystalline insulator, hosting topologically non-trivial surface states with potential applications in fault-tolerant quantum computing. Nanowires, due to their high surface-to-volume ratio, offer an ideal geometry for measuring these states. However, distinction of conductance from these topological surface states from the trivial bulk is currently hindered by a high bulk carrier density. Due to the small dimensions of nanowires, accurate measurements of the carrier density in SnTe nanowires have been lacking. Here, we measure the carrier density in SnTe nanoflakes and nanowires using the Hall effect. We find that nanoflakes, which allow for easier device fabrication, exhibit carrier densities and mobilities comparable to those of nanowires grown under identical conditions. This suggests that nanoflakes can serve as reliable proxies for probing the electronic properties of nanowires. Additionally, we present a growth model explaining the formation mechanism of SnTe nanoflakes and nanowires. Together, these findings provide a foundation for systematic tuning of carrier density through growth parameter optimization.
KW - SnTe
KW - Van der Pauw
KW - molecular beam epitaxy
KW - nanoflakes
KW - nanowires
KW - quantum materials
KW - topological crystalline insulator
UR - https://www.scopus.com/pages/publications/105020251312
U2 - 10.1088/2633-4356/ae10fd
DO - 10.1088/2633-4356/ae10fd
M3 - Article
SN - 2633-4356
VL - 5
SP - 045601
JO - Materials for Quantum Technology
JF - Materials for Quantum Technology
IS - 4
M1 - 045601
ER -