Structural and reflective characteristics of multilayers for 6.x nm wavelength

Research output: ThesisPhD Thesis - Research external, graduation UT

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The physics investigations described in this thesis have been inspired by the perspective of the application of La/B-based multilayer mirrors in photolithography. This perspective however, demands the highest possible reflectance of the mirrors and full control over the multilayer growth process. The corresponding research in this thesis therefore covers the following topics: a theoretical and experimental analysis of the spectral properties of La/B-based multilayer stacks, an experimental layer composition and growth study of the candidate La/B-based multilayer optics, and the development of techniques to enable characterization of the internal structure of such multilayers.
Original languageEnglish
QualificationDoctor of Philosophy
Awarding Institution
  • University of Twente
  • Bijkerk, Fred, Supervisor
  • Louis, Eric, Co-Supervisor
Award date31 Oct 2013
Place of PublicationEnschede
Print ISBNs978-94-6191-912-0
Publication statusPublished - 31 Oct 2013


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