Structural properties of subnanometer thick Y layers in extreme ultraviolet multilayer mirrors

J. Bosgra, E. Zoethout, A.M.J. Eerden, J. Verhoeven, Robbert Wilhelmus Elisabeth van de Kruijs, Andrey Yakshin, Frederik Bijkerk

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)

Abstract

We studied the structure and optical properties of B4C∕Mo∕Y∕Si multilayer systems. Using extended x-ray absorption fine structure measurements at the Y and Mo K-edge, the structure of the subnanometer thick Y layer and the underlying Mo layer were analyzed. It was found that even a 0.2 nm thick Y layer significantly reduced silicon diffusion toward Mo, thus reducing Mo silicide formation. Hard x-ray reflectometry showed that the difference in average interface roughness of the B4C∕Mo∕Y∕Si multilayer structure compared to Mo/Si and B4C∕Mo∕B4C∕Si multilayer structures was negligible. Soft x-ray reflectometry showed optical improvement of B4C∕Mo∕Y∕Si with respect to Mo/Si and B4C∕Mo∕B4C∕Si multilayer structures.
Original languageEnglish
Pages (from-to)8541-8548
Number of pages8
JournalApplied Optics
Volume51
Issue number36
DOIs
Publication statusPublished - 20 Dec 2012

Keywords

  • METIS-294176
  • IR-84108

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