Structural Test Generation for Embedded Analog Macros

V. Kaal, Hans G. Kerkhoff, J.S. Hollema

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the IEEE European Test Workshop (ETW)
    Place of PublicationSitges, Spain
    Number of pages2
    Publication statusPublished - 1 May 1998


    • METIS-112992

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