Structural Test Generation for Embedded Analog Macros

V. Kaal, Hans G. Kerkhoff, J.S. Hollema

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings of the IEEE European Test Workshop (ETW)
Place of Publication	Sitges, Spain
Pages	99-100
Number of pages	2
Publication status	Published - 1 May 1998

Keywords

@inproceedings{03de67e6a4b44e619e372b701270a91e,

title = "Structural Test Generation for Embedded Analog Macros",

keywords = "METIS-112992",

author = "V. Kaal and Kerkhoff, {Hans G.} and J.S. Hollema",

year = "1998",

month = may,

day = "1",

language = "Undefined",

pages = "99--100",

booktitle = "Proceedings of the IEEE European Test Workshop (ETW)",

}