Structural test generation for embedded analog macros

V. Kaal, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Keywords

@inproceedings{4b694eff56f941acad8f989b01ff54f9,

title = "Structural test generation for embedded analog macros",

keywords = "METIS-112974",

author = "V. Kaal and Kerkhoff, {Hans G.}",

year = "1997",

month = nov,

day = "27",

language = "Undefined",

isbn = "90-73461-12-X",

pages = "255--262",

booktitle = "Proceedings of IEEE CSSP97",

}