Structural Test Generation for Embedded Analog Macros

V. Kaal

    Research output: ThesisPhD Thesis - Research UT, graduation UT

    Original languageUndefined
    Supervisors/Advisors
    • Wallinga, Hans, Supervisor
    • Kerkhoff, Hans Gerard, Advisor
    Award date18 Jun 1998
    Place of PublicationUniversity of Twente, Enschede, the Netherlands
    Print ISBNs90-3651154-2
    Publication statusPublished - 18 Jun 1998

    Keywords

    • METIS-111475

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