Structural Testing of RSFQ Circuits

A.J. Arun; Hans G. Kerkhoff; Jakob Flokstra

Structural Testing of RSFQ Circuits

A.J. Arun, Hans G. Kerkhoff, Jakob Flokstra

Interfaces and Correlated Electron Systems

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

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Abstract

The RSFQ family of logic circuits built in Niobium (Nb) tri-layer processes are being widely used for designs in Superconductor Electronics (SCE). But little information is available about the defects and fault mechanisms occurring in an RSFQ Nb process.

Original language	Undefined
Title of host publication	The 10th International Superconductive Electronics Conference (ETS 2005/ISEC 2005)
Editors	Horst Rogalla, Alexander Brinkman
Place of Publication	Noordwijk, The Netherlands
Publisher	University of Twente
Pages	PB.13
Number of pages	1
ISBN (Print)	not assigned
Publication status	Published - 5 Sept 2005
Event	10th International Superconductive Electronics Conference, ISEC 2005 - Noordwijkerhout, The Netherlands, Noordwijkerhout, Netherlands Duration: 5 Sept 2005 → 9 Sept 2005 Conference number: 10

Publication series

Name
Publisher	University of Twente, Low Temperature Division

Conference

Conference	10th International Superconductive Electronics Conference, ISEC 2005
Abbreviated title	ISEC
Country/Territory	Netherlands
City	Noordwijkerhout
Period	5/09/05 → 9/09/05
Other	5-9 September 2005

Keywords

IR-76810
EWI-19980
METIS-226921

Access to Document

Cite this

@inproceedings{548306e36fe9442e8ba30d4c5f184146,

title = "Structural Testing of RSFQ Circuits",

abstract = "The RSFQ family of logic circuits built in Niobium (Nb) tri-layer processes are being widely used for designs in Superconductor Electronics (SCE). But little information is available about the defects and fault mechanisms occurring in an RSFQ Nb process.",

keywords = "IR-76810, EWI-19980, METIS-226921",

author = "A.J. Arun and Kerkhoff, {Hans G.} and Jakob Flokstra",

year = "2005",

month = sep,

day = "5",

language = "Undefined",

isbn = "not assigned",

publisher = "University of Twente",

pages = "PB.13",

editor = "Horst Rogalla and Alexander Brinkman",

booktitle = "The 10th International Superconductive Electronics Conference (ETS 2005/ISEC 2005)",

address = "Netherlands",

note = "10th International Superconductive Electronics Conference, ISEC 2005 ; Conference date: 05-09-2005 Through 09-09-2005",

}

Structural Testing of RSFQ Circuits. / Arun, A.J.; Kerkhoff, Hans G.; Flokstra, Jakob.
The 10th International Superconductive Electronics Conference (ETS 2005/ISEC 2005). ed. / Horst Rogalla; Alexander Brinkman. Noordwijk, The Netherlands: University of Twente, 2005. p. PB.13.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

TY - GEN

T1 - Structural Testing of RSFQ Circuits

AU - Arun, A.J.

AU - Kerkhoff, Hans G.

AU - Flokstra, Jakob

N1 - Conference code: 10

PY - 2005/9/5

Y1 - 2005/9/5

N2 - The RSFQ family of logic circuits built in Niobium (Nb) tri-layer processes are being widely used for designs in Superconductor Electronics (SCE). But little information is available about the defects and fault mechanisms occurring in an RSFQ Nb process.

AB - The RSFQ family of logic circuits built in Niobium (Nb) tri-layer processes are being widely used for designs in Superconductor Electronics (SCE). But little information is available about the defects and fault mechanisms occurring in an RSFQ Nb process.

KW - IR-76810

KW - EWI-19980

KW - METIS-226921

M3 - Conference contribution

SN - not assigned

SP - PB.13

BT - The 10th International Superconductive Electronics Conference (ETS 2005/ISEC 2005)

A2 - Rogalla, Horst

A2 - Brinkman, Alexander

PB - University of Twente

CY - Noordwijk, The Netherlands

T2 - 10th International Superconductive Electronics Conference, ISEC 2005

Y2 - 5 September 2005 through 9 September 2005

ER -