Structural Testing of RSFQ Circuits

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Abstract

The RSFQ family of logic circuits built in Niobium (Nb) tri-layer processes are being widely used for designs in Superconductor Electronics (SCE). But little information is available about the defects and fault mechanisms occurring in an RSFQ Nb process.
Original languageUndefined
Title of host publicationThe 10th International Superconductive Electronics Conference (ETS 2005/ISEC 2005)
EditorsHorst Rogalla, Alexander Brinkman
Place of PublicationNoordwijk, The Netherlands
PublisherUniversity of Twente, Low Temperature Division
PagesPB.13
Number of pages1
ISBN (Print)not assigned
Publication statusPublished - 5 Sep 2005
Event10th International Superconductive Electronics Conference, ISEC 2005 - Noordwijkerhout, The Netherlands, Noordwijkerhout, Netherlands
Duration: 5 Sep 20059 Sep 2005
Conference number: 10

Publication series

Name
PublisherUniversity of Twente, Low Temperature Division

Conference

Conference10th International Superconductive Electronics Conference, ISEC 2005
Abbreviated titleISEC
CountryNetherlands
CityNoordwijkerhout
Period5/09/059/09/05
Other5-9 September 2005

Keywords

  • IR-76810
  • EWI-19980
  • METIS-226921

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