Structure Determination of Thin Films on Thick Substrates

V. Vonk, S.J. van Reeuwijk, Sybolt Harkema, H. Graafsma

    Research output: Contribution to conferencePosterOther research output

    Original languageUndefined
    Pages-
    Publication statusPublished - 9 Apr 2001
    EventBijeenkomst CW-studiegroep Kristal- en Struktuuronderzoek 2001 - Lunteren, Netherlands
    Duration: 9 Apr 200110 Apr 2001

    Seminar

    SeminarBijeenkomst CW-studiegroep Kristal- en Struktuuronderzoek 2001
    CountryNetherlands
    CityLunteren
    Period9/04/0110/04/01

    Keywords

    • METIS-204688

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