Structure related intercalation behaviour of LiCoO2 films

P.J. Bouwman, Bernard A. Boukamp, Henricus J.M. Bouwmeester, P.H.L. Notten

Research output: Contribution to journalArticleAcademicpeer-review

47 Citations (Scopus)

Abstract

Submicron films of LiCoO2 have been deposited on silicon and stainless steel substrates using RF sputtering and pulsed laser deposition (PLD). Both films show preferred orientation. RF films have their Li diffusion plane oriented favourably, that is, perpendicular to the surface, while PLD films show a parallel, c-axis orientation. Electrochemical experiments indicate a strong dependence of the intercalation rate on the alignment of the host structure toward the electrolyte solution. Lithographic patterning enhances the inferior intercalation properties of the PLD film on silicon, as does the utilisation of stainless steel substrates.
Original languageUndefined
Pages (from-to)181-188-
JournalSolid state ionics
Volume152-153
DOIs
Publication statusPublished - 2002

Keywords

  • METIS-211207
  • IR-72246

Cite this

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title = "Structure related intercalation behaviour of LiCoO2 films",
abstract = "Submicron films of LiCoO2 have been deposited on silicon and stainless steel substrates using RF sputtering and pulsed laser deposition (PLD). Both films show preferred orientation. RF films have their Li diffusion plane oriented favourably, that is, perpendicular to the surface, while PLD films show a parallel, c-axis orientation. Electrochemical experiments indicate a strong dependence of the intercalation rate on the alignment of the host structure toward the electrolyte solution. Lithographic patterning enhances the inferior intercalation properties of the PLD film on silicon, as does the utilisation of stainless steel substrates.",
keywords = "METIS-211207, IR-72246",
author = "P.J. Bouwman and Boukamp, {Bernard A.} and Bouwmeester, {Henricus J.M.} and P.H.L. Notten",
year = "2002",
doi = "10.1016/S0167-2738(02)00298-9",
language = "Undefined",
volume = "152-153",
pages = "181--188--",
journal = "Solid state ionics",
issn = "0167-2738",
publisher = "Elsevier",

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Structure related intercalation behaviour of LiCoO2 films. / Bouwman, P.J.; Boukamp, Bernard A.; Bouwmeester, Henricus J.M.; Notten, P.H.L.

In: Solid state ionics, Vol. 152-153, 2002, p. 181-188-.

Research output: Contribution to journalArticleAcademicpeer-review

TY - JOUR

T1 - Structure related intercalation behaviour of LiCoO2 films

AU - Bouwman, P.J.

AU - Boukamp, Bernard A.

AU - Bouwmeester, Henricus J.M.

AU - Notten, P.H.L.

PY - 2002

Y1 - 2002

N2 - Submicron films of LiCoO2 have been deposited on silicon and stainless steel substrates using RF sputtering and pulsed laser deposition (PLD). Both films show preferred orientation. RF films have their Li diffusion plane oriented favourably, that is, perpendicular to the surface, while PLD films show a parallel, c-axis orientation. Electrochemical experiments indicate a strong dependence of the intercalation rate on the alignment of the host structure toward the electrolyte solution. Lithographic patterning enhances the inferior intercalation properties of the PLD film on silicon, as does the utilisation of stainless steel substrates.

AB - Submicron films of LiCoO2 have been deposited on silicon and stainless steel substrates using RF sputtering and pulsed laser deposition (PLD). Both films show preferred orientation. RF films have their Li diffusion plane oriented favourably, that is, perpendicular to the surface, while PLD films show a parallel, c-axis orientation. Electrochemical experiments indicate a strong dependence of the intercalation rate on the alignment of the host structure toward the electrolyte solution. Lithographic patterning enhances the inferior intercalation properties of the PLD film on silicon, as does the utilisation of stainless steel substrates.

KW - METIS-211207

KW - IR-72246

U2 - 10.1016/S0167-2738(02)00298-9

DO - 10.1016/S0167-2738(02)00298-9

M3 - Article

VL - 152-153

SP - 181-188-

JO - Solid state ionics

JF - Solid state ionics

SN - 0167-2738

ER -