Structured Scan Patterns Retargeting for Dynamic Instruments Access

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Abstract

The IEEE 1687 (iJTAG) standard introduces an efficient access network based on reconfigurable scan, for accessing the increasing number of embedded instruments. Pattern retargeting is defined as the process of translating an instrument pattern to several network-level scan vectors. In this paper, an efficient structured methodology is presented for performing dynamic pattern retargeting. Dynamic retargeting is required in case of runtime access of the iJTAG networks, for example in debugging or reliability management. The presented methodology enables faster pattern generation as compared to previous search-based methods which is necessary for runtime access. This methodology could be used in a lightweight iJTAG debugger or in a software-based on-chip iJTAG controller.
Original languageEnglish
Title of host publication2017 IEEE 35th VLSI Test Symposium (VTS)
PublisherIEEE
Number of pages6
ISBN (Electronic)978-1-5090-4482-5
ISBN (Print)978-1-5090-4483-2
DOIs
Publication statusPublished - 9 Apr 2017
Event35th IEEE VLSI Test Symposium, VTS 2017 - Caesars Palace, Las Vegas, United States
Duration: 9 Apr 201712 Apr 2017
Conference number: 35
http://tttc-vts.org/public_html/new/2017/

Conference

Conference35th IEEE VLSI Test Symposium, VTS 2017
Abbreviated titleVTS
CountryUnited States
CityLas Vegas
Period9/04/1712/04/17
Internet address

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Cite this

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title = "Structured Scan Patterns Retargeting for Dynamic Instruments Access",
abstract = "The IEEE 1687 (iJTAG) standard introduces an efficient access network based on reconfigurable scan, for accessing the increasing number of embedded instruments. Pattern retargeting is defined as the process of translating an instrument pattern to several network-level scan vectors. In this paper, an efficient structured methodology is presented for performing dynamic pattern retargeting. Dynamic retargeting is required in case of runtime access of the iJTAG networks, for example in debugging or reliability management. The presented methodology enables faster pattern generation as compared to previous search-based methods which is necessary for runtime access. This methodology could be used in a lightweight iJTAG debugger or in a software-based on-chip iJTAG controller.",
author = "Ibrahim, {Ahmed Mohammed Youssef} and Kerkhoff, {Hans G.}",
year = "2017",
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language = "English",
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publisher = "IEEE",
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}

Ibrahim, AMY & Kerkhoff, HG 2017, Structured Scan Patterns Retargeting for Dynamic Instruments Access. in 2017 IEEE 35th VLSI Test Symposium (VTS). IEEE, 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, United States, 9/04/17. https://doi.org/10.1109/VTS.2017.7928955

Structured Scan Patterns Retargeting for Dynamic Instruments Access. / Ibrahim, Ahmed Mohammed Youssef; Kerkhoff, Hans G.

2017 IEEE 35th VLSI Test Symposium (VTS). IEEE, 2017.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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