Structured Scan Patterns Retargeting for Dynamic Instruments Access

Ahmed Mohammed Youssef Ibrahim, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    3 Citations (Scopus)

    Abstract

    The IEEE 1687 (iJTAG) standard introduces an efficient access network based on reconfigurable scan, for accessing the increasing number of embedded instruments. Pattern retargeting is defined as the process of translating an instrument pattern to several network-level scan vectors. In this paper, an efficient structured methodology is presented for performing dynamic pattern retargeting. Dynamic retargeting is required in case of runtime access of the iJTAG networks, for example in debugging or reliability management. The presented methodology enables faster pattern generation as compared to previous search-based methods which is necessary for runtime access. This methodology could be used in a lightweight iJTAG debugger or in a software-based on-chip iJTAG controller.
    Original languageEnglish
    Title of host publication2017 IEEE 35th VLSI Test Symposium (VTS)
    PublisherIEEE
    Number of pages6
    ISBN (Electronic)978-1-5090-4482-5
    ISBN (Print)978-1-5090-4483-2
    DOIs
    Publication statusPublished - 9 Apr 2017
    Event35th IEEE VLSI Test Symposium, VTS 2017 - Caesars Palace, Las Vegas, United States
    Duration: 9 Apr 201712 Apr 2017
    Conference number: 35
    http://tttc-vts.org/public_html/new/2017/

    Conference

    Conference35th IEEE VLSI Test Symposium, VTS 2017
    Abbreviated titleVTS
    CountryUnited States
    CityLas Vegas
    Period9/04/1712/04/17
    Internet address

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