Structured Scan Patterns Retargeting for Dynamic Instruments Access

Ahmed Mohammed Youssef Ibrahim; Hans G. Kerkhoff

doi:10.1109/VTS.2017.7928955

Structured Scan Patterns Retargeting for Dynamic Instruments Access

Ahmed Mohammed Youssef Ibrahim, Hans G. Kerkhoff

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

4 Citations (Scopus)

Abstract

The IEEE 1687 (iJTAG) standard introduces an efficient access network based on reconfigurable scan, for accessing the increasing number of embedded instruments. Pattern retargeting is defined as the process of translating an instrument pattern to several network-level scan vectors. In this paper, an efficient structured methodology is presented for performing dynamic pattern retargeting. Dynamic retargeting is required in case of runtime access of the iJTAG networks, for example in debugging or reliability management. The presented methodology enables faster pattern generation as compared to previous search-based methods which is necessary for runtime access. This methodology could be used in a lightweight iJTAG debugger or in a software-based on-chip iJTAG controller.

Original language	English
Title of host publication	2017 IEEE 35th VLSI Test Symposium (VTS)
Publisher	IEEE
Number of pages	6
ISBN (Electronic)	978-1-5090-4482-5
ISBN (Print)	978-1-5090-4483-2
DOIs	https://doi.org/10.1109/VTS.2017.7928955
Publication status	Published - 9 Apr 2017
Event	35th IEEE VLSI Test Symposium, VTS 2017 - Caesars Palace, Las Vegas, United States Duration: 9 Apr 2017 → 12 Apr 2017 Conference number: 35 http://tttc-vts.org/public_html/new/2017/

Conference

Conference	35th IEEE VLSI Test Symposium, VTS 2017
Abbreviated title	VTS
Country/Territory	United States
City	Las Vegas
Period	9/04/17 → 12/04/17
Internet address	http://tttc-vts.org/public_html/new/2017/

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10.1109/VTS.2017.7928955

Cite this

@inproceedings{df822e642115484bbce74695c663e37a,

title = "Structured Scan Patterns Retargeting for Dynamic Instruments Access",

abstract = "The IEEE 1687 (iJTAG) standard introduces an efficient access network based on reconfigurable scan, for accessing the increasing number of embedded instruments. Pattern retargeting is defined as the process of translating an instrument pattern to several network-level scan vectors. In this paper, an efficient structured methodology is presented for performing dynamic pattern retargeting. Dynamic retargeting is required in case of runtime access of the iJTAG networks, for example in debugging or reliability management. The presented methodology enables faster pattern generation as compared to previous search-based methods which is necessary for runtime access. This methodology could be used in a lightweight iJTAG debugger or in a software-based on-chip iJTAG controller.",

author = "Ibrahim, {Ahmed Mohammed Youssef} and Kerkhoff, {Hans G.}",

year = "2017",

month = apr,

day = "9",

doi = "10.1109/VTS.2017.7928955",

language = "English",

isbn = "978-1-5090-4483-2",

booktitle = "2017 IEEE 35th VLSI Test Symposium (VTS)",

publisher = "IEEE",

address = "United States",

note = "35th IEEE VLSI Test Symposium, VTS 2017, VTS ; Conference date: 09-04-2017 Through 12-04-2017",

url = "http://tttc-vts.org/public_html/new/2017/",

}

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T1 - Structured Scan Patterns Retargeting for Dynamic Instruments Access

AU - Ibrahim, Ahmed Mohammed Youssef

AU - Kerkhoff, Hans G.

N1 - Conference code: 35

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N2 - The IEEE 1687 (iJTAG) standard introduces an efficient access network based on reconfigurable scan, for accessing the increasing number of embedded instruments. Pattern retargeting is defined as the process of translating an instrument pattern to several network-level scan vectors. In this paper, an efficient structured methodology is presented for performing dynamic pattern retargeting. Dynamic retargeting is required in case of runtime access of the iJTAG networks, for example in debugging or reliability management. The presented methodology enables faster pattern generation as compared to previous search-based methods which is necessary for runtime access. This methodology could be used in a lightweight iJTAG debugger or in a software-based on-chip iJTAG controller.

AB - The IEEE 1687 (iJTAG) standard introduces an efficient access network based on reconfigurable scan, for accessing the increasing number of embedded instruments. Pattern retargeting is defined as the process of translating an instrument pattern to several network-level scan vectors. In this paper, an efficient structured methodology is presented for performing dynamic pattern retargeting. Dynamic retargeting is required in case of runtime access of the iJTAG networks, for example in debugging or reliability management. The presented methodology enables faster pattern generation as compared to previous search-based methods which is necessary for runtime access. This methodology could be used in a lightweight iJTAG debugger or in a software-based on-chip iJTAG controller.

U2 - 10.1109/VTS.2017.7928955

DO - 10.1109/VTS.2017.7928955

M3 - Conference contribution

SN - 978-1-5090-4483-2

BT - 2017 IEEE 35th VLSI Test Symposium (VTS)

PB - IEEE

T2 - 35th IEEE VLSI Test Symposium, VTS 2017

Y2 - 9 April 2017 through 12 April 2017

ER -

Structured Scan Patterns Retargeting for Dynamic Instruments Access

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