Study of dynamics of charge trapping in a-Si:H/SiN TFTs

A.R. Merticaru, A.J. Mouthaan

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings of the SAFE 2000 Conference
    Place of PublicationVeldhoven, The Netherlands
    Pages97-100
    Publication statusPublished - 29 Nov 2000

    Keywords

    • METIS-113906

    Cite this

    Merticaru, A. R., & Mouthaan, A. J. (2000). Study of dynamics of charge trapping in a-Si:H/SiN TFTs. In Proceedings of the SAFE 2000 Conference (pp. 97-100). Veldhoven, The Netherlands.