Study of ramp-type Josephson junctions by HREM

K. Verbist, O.I. Lebedev, G. van Tendeloo, M.A.J. Verhoeven, A.J.H.M. Rijnders, D.H.A. Blank

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Abstract

Structural aspects of ramp-type Josephson junctions based on REBa2Cu3O7-δ high-Tc superconductors, are investigated by cross-section transmission electron microscopy and results related to fabrication process or physical properties. The barrier layer material is PrBa2Cu3-xGaxO7-δ. The ramp-geometry depends on the etching conditions. High levels of Ga doping (x>0.7) influence the microstructure of the barrier layer thereby changing the junctions properties.
Original languageEnglish
Title of host publicationApplied superconductivity 1997
Subtitle of host publicationproceedings of EUCAS 1997, the Third European Conference on Applied Superconductivity, held in the Netherlands, 30 June-3 July 1997
EditorsH. Rogalla, D.H.A. Blank
Place of PublicationBristol ; Philadelphia
PublisherIOP Publishing
Pages49-52
ISBN (Print)0750304871
Publication statusPublished - 19 Dec 1997
Event3rd European Conference on Applied Superconductivity, EUCAS 1997 - Veldhoven, Netherlands
Duration: 30 Jun 19973 Jul 1997
Conference number: 3

Publication series

NameInstitute of Physics Conference Series
PublisherIOP Publishing
Volume158

Conference

Conference3rd European Conference on Applied Superconductivity, EUCAS 1997
Abbreviated titleEUCAS
CountryNetherlands
CityVeldhoven
Period30/06/973/07/97

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barrier layers
ramps
Josephson junctions
physical properties
etching
transmission electron microscopy
microstructure
fabrication
cross sections
geometry

Cite this

Verbist, K., Lebedev, O. I., van Tendeloo, G., Verhoeven, M. A. J., Rijnders, A. J. H. M., & Blank, D. H. A. (1997). Study of ramp-type Josephson junctions by HREM. In H. Rogalla, & D. H. A. Blank (Eds.), Applied superconductivity 1997: proceedings of EUCAS 1997, the Third European Conference on Applied Superconductivity, held in the Netherlands, 30 June-3 July 1997 (pp. 49-52). (Institute of Physics Conference Series; Vol. 158). Bristol ; Philadelphia: IOP Publishing.
Verbist, K. ; Lebedev, O.I. ; van Tendeloo, G. ; Verhoeven, M.A.J. ; Rijnders, A.J.H.M. ; Blank, D.H.A. / Study of ramp-type Josephson junctions by HREM. Applied superconductivity 1997: proceedings of EUCAS 1997, the Third European Conference on Applied Superconductivity, held in the Netherlands, 30 June-3 July 1997. editor / H. Rogalla ; D.H.A. Blank. Bristol ; Philadelphia : IOP Publishing, 1997. pp. 49-52 (Institute of Physics Conference Series).
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title = "Study of ramp-type Josephson junctions by HREM",
abstract = "Structural aspects of ramp-type Josephson junctions based on REBa2Cu3O7-δ high-Tc superconductors, are investigated by cross-section transmission electron microscopy and results related to fabrication process or physical properties. The barrier layer material is PrBa2Cu3-xGaxO7-δ. The ramp-geometry depends on the etching conditions. High levels of Ga doping (x>0.7) influence the microstructure of the barrier layer thereby changing the junctions properties.",
author = "K. Verbist and O.I. Lebedev and {van Tendeloo}, G. and M.A.J. Verhoeven and A.J.H.M. Rijnders and D.H.A. Blank",
year = "1997",
month = "12",
day = "19",
language = "English",
isbn = "0750304871",
series = "Institute of Physics Conference Series",
publisher = "IOP Publishing",
pages = "49--52",
editor = "H. Rogalla and D.H.A. Blank",
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}

Verbist, K, Lebedev, OI, van Tendeloo, G, Verhoeven, MAJ, Rijnders, AJHM & Blank, DHA 1997, Study of ramp-type Josephson junctions by HREM. in H Rogalla & DHA Blank (eds), Applied superconductivity 1997: proceedings of EUCAS 1997, the Third European Conference on Applied Superconductivity, held in the Netherlands, 30 June-3 July 1997. Institute of Physics Conference Series, vol. 158, IOP Publishing, Bristol ; Philadelphia, pp. 49-52, 3rd European Conference on Applied Superconductivity, EUCAS 1997, Veldhoven, Netherlands, 30/06/97.

Study of ramp-type Josephson junctions by HREM. / Verbist, K.; Lebedev, O.I.; van Tendeloo, G.; Verhoeven, M.A.J.; Rijnders, A.J.H.M.; Blank, D.H.A.

Applied superconductivity 1997: proceedings of EUCAS 1997, the Third European Conference on Applied Superconductivity, held in the Netherlands, 30 June-3 July 1997. ed. / H. Rogalla; D.H.A. Blank. Bristol ; Philadelphia : IOP Publishing, 1997. p. 49-52 (Institute of Physics Conference Series; Vol. 158).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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T1 - Study of ramp-type Josephson junctions by HREM

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AU - Lebedev, O.I.

AU - van Tendeloo, G.

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AU - Rijnders, A.J.H.M.

AU - Blank, D.H.A.

PY - 1997/12/19

Y1 - 1997/12/19

N2 - Structural aspects of ramp-type Josephson junctions based on REBa2Cu3O7-δ high-Tc superconductors, are investigated by cross-section transmission electron microscopy and results related to fabrication process or physical properties. The barrier layer material is PrBa2Cu3-xGaxO7-δ. The ramp-geometry depends on the etching conditions. High levels of Ga doping (x>0.7) influence the microstructure of the barrier layer thereby changing the junctions properties.

AB - Structural aspects of ramp-type Josephson junctions based on REBa2Cu3O7-δ high-Tc superconductors, are investigated by cross-section transmission electron microscopy and results related to fabrication process or physical properties. The barrier layer material is PrBa2Cu3-xGaxO7-δ. The ramp-geometry depends on the etching conditions. High levels of Ga doping (x>0.7) influence the microstructure of the barrier layer thereby changing the junctions properties.

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T3 - Institute of Physics Conference Series

SP - 49

EP - 52

BT - Applied superconductivity 1997

A2 - Rogalla, H.

A2 - Blank, D.H.A.

PB - IOP Publishing

CY - Bristol ; Philadelphia

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Verbist K, Lebedev OI, van Tendeloo G, Verhoeven MAJ, Rijnders AJHM, Blank DHA. Study of ramp-type Josephson junctions by HREM. In Rogalla H, Blank DHA, editors, Applied superconductivity 1997: proceedings of EUCAS 1997, the Third European Conference on Applied Superconductivity, held in the Netherlands, 30 June-3 July 1997. Bristol ; Philadelphia: IOP Publishing. 1997. p. 49-52. (Institute of Physics Conference Series).