Study of ramp-type Josephson junctions by HREM

K. Verbist, O.I. Lebedev, G. van Tendeloo, M.A.J. Verhoeven, A.J.H.M. Rijnders, D.H.A. Blank

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Structural aspects of ramp-type Josephson junctions based on REBa2Cu3O7-δ high-Tc superconductors, are investigated by cross-section transmission electron microscopy and results related to fabrication process or physical properties. The barrier layer material is PrBa2Cu3-xGaxO7-δ. The ramp-geometry depends on the etching conditions. High levels of Ga doping (x>0.7) influence the microstructure of the barrier layer thereby changing the junctions properties.
Original languageEnglish
Title of host publicationApplied superconductivity 1997
Subtitle of host publicationproceedings of EUCAS 1997, the Third European Conference on Applied Superconductivity, held in the Netherlands, 30 June-3 July 1997
EditorsH. Rogalla, D.H.A. Blank
Place of PublicationBristol ; Philadelphia
PublisherIOP Publishing
ISBN (Print)0750304871
Publication statusPublished - 19 Dec 1997
Event3rd European Conference on Applied Superconductivity, EUCAS 1997 - Veldhoven, Netherlands
Duration: 30 Jun 19973 Jul 1997
Conference number: 3

Publication series

NameInstitute of Physics Conference Series
PublisherIOP Publishing


Conference3rd European Conference on Applied Superconductivity, EUCAS 1997
Abbreviated titleEUCAS

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