Structural aspects of ramp-type Josephson junctions based on REBa2Cu3O7-δ high-Tc superconductors, are investigated by cross-section transmission electron microscopy and results related to fabrication process or physical properties. The barrier layer material is PrBa2Cu3-xGaxO7-δ. The ramp-geometry depends on the etching conditions. High levels of Ga doping (x>0.7) influence the microstructure of the barrier layer thereby changing the junctions properties.
|Title of host publication||Applied superconductivity 1997|
|Subtitle of host publication||proceedings of EUCAS 1997, the Third European Conference on Applied Superconductivity, held in the Netherlands, 30 June-3 July 1997|
|Editors||H. Rogalla, D.H.A. Blank|
|Place of Publication||Bristol ; Philadelphia|
|Publication status||Published - 19 Dec 1997|
|Event||3rd European Conference on Applied Superconductivity, EUCAS 1997 - Veldhoven, Netherlands|
Duration: 30 Jun 1997 → 3 Jul 1997
Conference number: 3
|Name||Institute of Physics Conference Series|
|Conference||3rd European Conference on Applied Superconductivity, EUCAS 1997|
|Period||30/06/97 → 3/07/97|
Verbist, K., Lebedev, O. I., van Tendeloo, G., Verhoeven, M. A. J., Rijnders, A. J. H. M., & Blank, D. H. A. (1997). Study of ramp-type Josephson junctions by HREM. In H. Rogalla, & D. H. A. Blank (Eds.), Applied superconductivity 1997: proceedings of EUCAS 1997, the Third European Conference on Applied Superconductivity, held in the Netherlands, 30 June-3 July 1997 (pp. 49-52). (Institute of Physics Conference Series; Vol. 158). Bristol ; Philadelphia: IOP Publishing.