Study of the effects of SET induced faults on submicron technologies

A. Rohani, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    2 Citations (Scopus)
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    the progression of shrinking technologies into processes below 100nm has increased the importance of transient faults in digital systems. Fault injection into the HDL model of the system, known as simulation-based fault injection, is being increasingly used in recent years in order to evaluate the behaviour of systems in the presence of transient faults. However, there are still several questions in conducting simulation-based fault injections. For instance, what is the importance of timing information of the netlist with regard to the accuracy of fault injection results? And how does the number of fault injection experiments relate to obtain a realistic behaviour of the processor under test. Finally, what is the dependence of fault injection results on the processor’s workload? This paper aims to answer these questions, by studying the effects of transient faults on a post placed-androuted Verilog netlist of a high performance reconfigurable processor in 90-nanometer UMC technology.
    Original languageUndefined
    Title of host publication41st IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN-W 2011
    Place of PublicationUSA
    Number of pages6
    ISBN (Print)978-1-4577-0374-4
    Publication statusPublished - 27 Jun 2011
    Event41st Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2011 - Hong Kong, Hong Kong
    Duration: 27 Jun 201130 Jun 2011
    Conference number: 41

    Publication series

    PublisherIEEE Computer Society


    Conference41st Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2011
    Abbreviated titleDSN 2011
    Country/TerritoryHong Kong
    CityHong Kong


    • METIS-277739
    • IR-77813
    • Soft Errors
    • EWI-20391
    • SET
    • Fault injection
    • fault simulations

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