Study of the effects of SET induced faults on submicron technologies

A. Rohani, Hans G. Kerkhoff

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    2 Citations (Scopus)

    Abstract

    the progression of shrinking technologies into processes below 100nm has increased the importance of transient faults in digital systems. Fault injection into the HDL model of the system, known as simulation-based fault injection, is being increasingly used in recent years in order to evaluate the behaviour of systems in the presence of transient faults. However, there are still several questions in conducting simulation-based fault injections. For instance, what is the importance of timing information of the netlist with regard to the accuracy of fault injection results? And how does the number of fault injection experiments relate to obtain a realistic behaviour of the processor under test. Finally, what is the dependence of fault injection results on the processor’s workload? This paper aims to answer these questions, by studying the effects of transient faults on a post placed-androuted Verilog netlist of a high performance reconfigurable processor in 90-nanometer UMC technology.
    Original languageUndefined
    Title of host publication41st IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN-W 2011
    Place of PublicationUSA
    PublisherIEEE Computer Society
    Pages41-46
    Number of pages6
    ISBN (Print)978-1-4577-0374-4
    DOIs
    Publication statusPublished - 27 Jun 2011

    Publication series

    Name
    PublisherIEEE Computer Society

    Keywords

    • METIS-277739
    • IR-77813
    • Soft Errors
    • EWI-20391
    • SET
    • Fault injection
    • fault simulations

    Cite this

    Rohani, A., & Kerkhoff, H. G. (2011). Study of the effects of SET induced faults on submicron technologies. In 41st IEEE/IFIP International Conference on Dependable Systems and Networks Workshops, DSN-W 2011 (pp. 41-46). USA: IEEE Computer Society. https://doi.org/10.1109/DSNW.2011.5958833