Study of the leakage field of magnetic force microscopy thin-film tips using electron holography

B.G. Frost; N.F. van Hulst; E. Lunedei; G. Matteucci; E. Rikkers

doi:10.1063/1.116039

Study of the leakage field of magnetic force microscopy thin-film tips using electron holography

B.G. Frost, N.F. van Hulst, E. Lunedei, G. Matteucci, E. Rikkers

Research output: Contribution to journal › Article › Academic › peer-review

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Abstract

Electron holography is applied for the study of the leakage field of thin-film ferromagnetic tips used as probes in magnetic force microscopy. We used commercially available pyramidal tips covered on one face with a thin NiCo film, which were then placed in a high external magnetic field directed along the pyramid axis. Good agreement between simulated and experimental electron phase difference maps allows to measure the local flux from the ferromagnetic tips and therefore to evaluate the perturbation induced by the microprobe stray field on the sample area.

Original language	Undefined
Pages (from-to)	1865-1867
Number of pages	3
Journal	Applied physics letters
Volume	68
Issue number	13
DOIs	https://doi.org/10.1063/1.116039
Publication status	Published - 1996

Keywords

METIS-129359
IR-24558

Access to Document

10.1063/1.116039

Frost96study

Cite this

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abstract = "Electron holography is applied for the study of the leakage field of thin-film ferromagnetic tips used as probes in magnetic force microscopy. We used commercially available pyramidal tips covered on one face with a thin NiCo film, which were then placed in a high external magnetic field directed along the pyramid axis. Good agreement between simulated and experimental electron phase difference maps allows to measure the local flux from the ferromagnetic tips and therefore to evaluate the perturbation induced by the microprobe stray field on the sample area.",

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AU - Lunedei, E.

AU - Matteucci, G.

AU - Rikkers, E.

PY - 1996

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AB - Electron holography is applied for the study of the leakage field of thin-film ferromagnetic tips used as probes in magnetic force microscopy. We used commercially available pyramidal tips covered on one face with a thin NiCo film, which were then placed in a high external magnetic field directed along the pyramid axis. Good agreement between simulated and experimental electron phase difference maps allows to measure the local flux from the ferromagnetic tips and therefore to evaluate the perturbation induced by the microprobe stray field on the sample area.

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U2 - 10.1063/1.116039

DO - 10.1063/1.116039

M3 - Article

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