Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy

P. Le Minh, J. Holleman, Hans Wallinga

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationAmeland, the Netherlands
    Publication statusPublished - 13 Jun 1999

    Keywords

    • METIS-114855

    Cite this

    Le Minh, P., Holleman, J., & Wallinga, H. (1999, Jun 13). Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy. Ameland, the Netherlands.
    Le Minh, P. ; Holleman, J. ; Wallinga, Hans. / Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy. 1999. Ameland, the Netherlands.
    @misc{15e95878e83b4dd5aec71147007ae17f,
    title = "Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy",
    keywords = "METIS-114855",
    author = "{Le Minh}, P. and J. Holleman and Hans Wallinga",
    year = "1999",
    month = "6",
    day = "13",
    language = "Undefined",
    type = "Other",

    }

    Le Minh, P, Holleman, J & Wallinga, H 1999, Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy. Ameland, the Netherlands.

    Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy. / Le Minh, P.; Holleman, J.; Wallinga, Hans.

    Ameland, the Netherlands. 1999, .

    Research output: Other contributionOther research output

    TY - GEN

    T1 - Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy

    AU - Le Minh, P.

    AU - Holleman, J.

    AU - Wallinga, Hans

    PY - 1999/6/13

    Y1 - 1999/6/13

    KW - METIS-114855

    M3 - Other contribution

    CY - Ameland, the Netherlands

    ER -