Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy

P. Le Minh, J. Holleman, Hans Wallinga

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationAmeland, the Netherlands
    Publication statusPublished - 13 Jun 1999

    Keywords

    • METIS-114855

    Cite this

    Le Minh, P., Holleman, J., & Wallinga, H. (1999, Jun 13). Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy. Ameland, the Netherlands.