Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy

P. Le Minh, J. Holleman, Hans Wallinga

Research output: Other contributionOther research output

Original languageUndefined
Place of PublicationAmeland, the Netherlands
Publication statusPublished - 13 Jun 1999

Keywords

  • METIS-114855

Cite this

Le Minh, P., Holleman, J., & Wallinga, H. (1999, Jun 13). Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy. Ameland, the Netherlands.
Le Minh, P. ; Holleman, J. ; Wallinga, Hans. / Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy. 1999. Ameland, the Netherlands.
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title = "Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy",
keywords = "METIS-114855",
author = "{Le Minh}, P. and J. Holleman and Hans Wallinga",
year = "1999",
month = "6",
day = "13",
language = "Undefined",
type = "Other",

}

Le Minh, P, Holleman, J & Wallinga, H 1999, Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy. Ameland, the Netherlands.

Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy. / Le Minh, P.; Holleman, J.; Wallinga, Hans.

Ameland, the Netherlands. 1999, .

Research output: Other contributionOther research output

TY - GEN

T1 - Study of Thin Dielectric Breakdown Spot with Extended Scanning Probe Microscopy

AU - Le Minh, P.

AU - Holleman, J.

AU - Wallinga, Hans

PY - 1999/6/13

Y1 - 1999/6/13

KW - METIS-114855

M3 - Other contribution

CY - Ameland, the Netherlands

ER -