Sub-wavelength scale characterization of on-chip coupling mirrors

V.V. Tkachuk*, J.P. Korterik, L. Chang, H.L. Offerhaus

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)
17 Downloads (Pure)

Abstract

Miniature free-space optical beams, originating from on-chip microstructures, are usually measured and quoted without reference to a particular polarization state. We develop an automated platform to characterize tightly focused free-space optical beams in three dimensions. We present a detailed description of each subsystem including the calibration and test procedure. We demonstrate how amplitude and phase are measured at sub-wavelength resolution using a cleaved fiber with a heterodyne reference. Further analysis provides information about the phase and intensity profile of the beam with regards to its polarization content and spatial confinement. We perform a proof-of-concept experiment for a custom waveguide-coupled micro-mirror. The work opens new possibilities for rapid analysis of micro-mirrors in prototyping and optimization of integrated optical systems.

Original languageEnglish
Pages (from-to)2972-2981
Number of pages10
JournalOptics express
Volume32
Issue number3
DOIs
Publication statusPublished - 29 Jan 2024

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