Suppression of soft ESD failures in a submicron CMOS process

F.G. Kuper, J.R.M. Luchies, J. Bruines

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    12 Citations (Scopus)
    Original languageUndefined
    Title of host publicationProceedings Symposium Electrical Overstress/Electrostatic Discharge
    Place of PublicationLake Buena Vista, Florida
    Pages3.6.1-3.6.6
    Publication statusPublished - 28 Sep 1993

    Keywords

    • METIS-113996

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