Suppression of soft ESD failures in a submicron CMOS process

F.G. Kuper, J.R.M. Luchies, J. Bruines

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings Symposium Electrical Overstress/Electrostatic Discharge
Place of Publication	Lake Buena Vista, Florida
Pages	3.6.1-3.6.6
Publication status	Published - 28 Sept 1993

Keywords

@inproceedings{a6f18186a273426280cfa7af91efd5d0,

title = "Suppression of soft ESD failures in a submicron CMOS process",

keywords = "METIS-113996",

author = "F.G. Kuper and J.R.M. Luchies and J. Bruines",

year = "1993",

month = sep,

day = "28",

language = "Undefined",

pages = "3.6.1--3.6.6",

booktitle = "Proceedings Symposium Electrical Overstress/Electrostatic Discharge",

}