Suppression of soft failures in a submicron CMOS process

F.G. Kuper, J.R.M. Luchies, J. Bruines

    Research output: Other contributionOther research output

    Original languageUndefined
    Place of PublicationOrlando
    Publication statusPublished - 28 Sep 1993

    Keywords

    • METIS-117271

    Cite this

    Kuper, F. G., Luchies, J. R. M., & Bruines, J. (1993, Sep 28). Suppression of soft failures in a submicron CMOS process. Orlando.
    Kuper, F.G. ; Luchies, J.R.M. ; Bruines, J. / Suppression of soft failures in a submicron CMOS process. 1993. Orlando.
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    title = "Suppression of soft failures in a submicron CMOS process",
    keywords = "METIS-117271",
    author = "F.G. Kuper and J.R.M. Luchies and J. Bruines",
    year = "1993",
    month = "9",
    day = "28",
    language = "Undefined",
    type = "Other",

    }

    Kuper, FG, Luchies, JRM & Bruines, J 1993, Suppression of soft failures in a submicron CMOS process. Orlando.

    Suppression of soft failures in a submicron CMOS process. / Kuper, F.G.; Luchies, J.R.M.; Bruines, J.

    Orlando. 1993, .

    Research output: Other contributionOther research output

    TY - GEN

    T1 - Suppression of soft failures in a submicron CMOS process

    AU - Kuper, F.G.

    AU - Luchies, J.R.M.

    AU - Bruines, J.

    PY - 1993/9/28

    Y1 - 1993/9/28

    KW - METIS-117271

    M3 - Other contribution

    CY - Orlando

    ER -

    Kuper FG, Luchies JRM, Bruines J. Suppression of soft failures in a submicron CMOS process. 1993.