Surface adhesion and its dependence on surface roughness and humidity measured with a flat AFM tip

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Abstract

The adhesion force between a surface and the tip of an atomic force microscope cantilever has been determined by recording force–distance curves with an atomic force microscope. Flat tips with a diameter of 2 μm were used to mimic the adhesion between two parallel surfaces. In such a configuration, the location for the formation and breaking of the capillary water neck is a stochastic by nature, significantly different from that of a spherical tip. The adhesion force is measured as a function of relative humidity for smooth and chemically etched Si(1 0 0) surfaces. The roughness of the etched substrate reduces the adhesion by more than an order of magnitude, depending on the exact value of the relative humidity. The adhesion force increases with increasing humidity until a relative humidity of about 70%. Beyond a relative humidity of 70% a decrease of the adhesion force is observed. We anticipate that the latter is due to a decrease of the cross section of the water neck at the snap off point with increasing relative humidity
Original languageEnglish
Article number5
Pages (from-to)6938-6942
Number of pages5
JournalApplied surface science
Volume258
Issue number18
DOIs
Publication statusPublished - 2012

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Atmospheric humidity
Adhesion
Surface roughness
Microscopes
Water
Substrates

Keywords

  • Optics (see also 3311)Solid state physics (see also 2307)Niet in een andere rubriek onder te brengen
  • IR-81101
  • METIS-287281

Cite this

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title = "Surface adhesion and its dependence on surface roughness and humidity measured with a flat AFM tip",
abstract = "The adhesion force between a surface and the tip of an atomic force microscope cantilever has been determined by recording force–distance curves with an atomic force microscope. Flat tips with a diameter of 2 μm were used to mimic the adhesion between two parallel surfaces. In such a configuration, the location for the formation and breaking of the capillary water neck is a stochastic by nature, significantly different from that of a spherical tip. The adhesion force is measured as a function of relative humidity for smooth and chemically etched Si(1 0 0) surfaces. The roughness of the etched substrate reduces the adhesion by more than an order of magnitude, depending on the exact value of the relative humidity. The adhesion force increases with increasing humidity until a relative humidity of about 70{\%}. Beyond a relative humidity of 70{\%} a decrease of the adhesion force is observed. We anticipate that the latter is due to a decrease of the cross section of the water neck at the snap off point with increasing relative humidity",
keywords = "Optics (see also 3311)Solid state physics (see also 2307)Niet in een andere rubriek onder te brengen, IR-81101, METIS-287281",
author = "A. Colak and Herbert Wormeester and Zandvliet, {Henricus J.W.} and Bene Poelsema",
year = "2012",
doi = "10.1016/j.apsusc.2012.03.138",
language = "English",
volume = "258",
pages = "6938--6942",
journal = "Applied surface science",
issn = "0169-4332",
publisher = "Elsevier",
number = "18",

}

Surface adhesion and its dependence on surface roughness and humidity measured with a flat AFM tip. / Colak, A.; Wormeester, Herbert; Zandvliet, Henricus J.W.; Poelsema, Bene.

In: Applied surface science, Vol. 258, No. 18, 5, 2012, p. 6938-6942.

Research output: Contribution to journalArticleAcademicpeer-review

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T1 - Surface adhesion and its dependence on surface roughness and humidity measured with a flat AFM tip

AU - Colak, A.

AU - Wormeester, Herbert

AU - Zandvliet, Henricus J.W.

AU - Poelsema, Bene

PY - 2012

Y1 - 2012

N2 - The adhesion force between a surface and the tip of an atomic force microscope cantilever has been determined by recording force–distance curves with an atomic force microscope. Flat tips with a diameter of 2 μm were used to mimic the adhesion between two parallel surfaces. In such a configuration, the location for the formation and breaking of the capillary water neck is a stochastic by nature, significantly different from that of a spherical tip. The adhesion force is measured as a function of relative humidity for smooth and chemically etched Si(1 0 0) surfaces. The roughness of the etched substrate reduces the adhesion by more than an order of magnitude, depending on the exact value of the relative humidity. The adhesion force increases with increasing humidity until a relative humidity of about 70%. Beyond a relative humidity of 70% a decrease of the adhesion force is observed. We anticipate that the latter is due to a decrease of the cross section of the water neck at the snap off point with increasing relative humidity

AB - The adhesion force between a surface and the tip of an atomic force microscope cantilever has been determined by recording force–distance curves with an atomic force microscope. Flat tips with a diameter of 2 μm were used to mimic the adhesion between two parallel surfaces. In such a configuration, the location for the formation and breaking of the capillary water neck is a stochastic by nature, significantly different from that of a spherical tip. The adhesion force is measured as a function of relative humidity for smooth and chemically etched Si(1 0 0) surfaces. The roughness of the etched substrate reduces the adhesion by more than an order of magnitude, depending on the exact value of the relative humidity. The adhesion force increases with increasing humidity until a relative humidity of about 70%. Beyond a relative humidity of 70% a decrease of the adhesion force is observed. We anticipate that the latter is due to a decrease of the cross section of the water neck at the snap off point with increasing relative humidity

KW - Optics (see also 3311)Solid state physics (see also 2307)Niet in een andere rubriek onder te brengen

KW - IR-81101

KW - METIS-287281

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JO - Applied surface science

JF - Applied surface science

SN - 0169-4332

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