Surface and grain boundary analysis of doped zirconia ceramics by AES and XPS

G.S.A.M. Theunissen; A.J.A. Winnubst; A.J. Burggraaf

doi:10.1007/BF01105274

Surface and grain boundary analysis of doped zirconia ceramics by AES and XPS

G.S.A.M. Theunissen, A.J.A. Winnubst^*, A.J. Burggraaf

^*Corresponding author for this work

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Abstract

The surface- and grain boundary composition of Y, Ce and Ti doped zirconia were studied by X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy/Scanning Auger Microscopy. The grain boundaries and free surfaces showed the same enrichment levels. After heat treatment ge 1000 DaggerC all yttria doped samples showed yttrium enrichment. In the ZrO₂-Y₂O₃ system the yttrium enrichment did not depend on the bulk concentration and amounted 30–34 mol% YO_1.5 in all cases. As a consequence the segregation factor increases with decreasing solute concentration in the bulk. The thickness of the segregation layer was about 2–4 nm. In the ternary Y doped systems yttrium is the main segregant. In ceria-doped tetragonal zirconia polycrystals (Ce-TZP) systems significant segregation of cerium starts at T≥1300‡C and is mainly attributed to Ce³⁺. In Y,Ti-TZP systems also strong segregation of Ti⁴⁺ occurs. The absolute value of the increase of the surface concentration in fine grained material is smaller than in coarse grained material. This is mainly due to depletion of the bulk.

Original language	English
Pages (from-to)	5057-5066
Number of pages	10
Journal	Journal of materials science
Volume	27
Issue number	18
DOIs	https://doi.org/10.1007/BF01105274
Publication status	Published - 1992

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title = "Surface and grain boundary analysis of doped zirconia ceramics by AES and XPS",

abstract = "The surface- and grain boundary composition of Y, Ce and Ti doped zirconia were studied by X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy/Scanning Auger Microscopy. The grain boundaries and free surfaces showed the same enrichment levels. After heat treatment ge 1000 DaggerC all yttria doped samples showed yttrium enrichment. In the ZrO2-Y2O3 system the yttrium enrichment did not depend on the bulk concentration and amounted 30–34 mol% YO1.5 in all cases. As a consequence the segregation factor increases with decreasing solute concentration in the bulk. The thickness of the segregation layer was about 2–4 nm. In the ternary Y doped systems yttrium is the main segregant. In ceria-doped tetragonal zirconia polycrystals (Ce-TZP) systems significant segregation of cerium starts at T≥1300‡C and is mainly attributed to Ce3+. In Y,Ti-TZP systems also strong segregation of Ti4+ occurs. The absolute value of the increase of the surface concentration in fine grained material is smaller than in coarse grained material. This is mainly due to depletion of the bulk.",

author = "G.S.A.M. Theunissen and A.J.A. Winnubst and A.J. Burggraaf",

year = "1992",

doi = "10.1007/BF01105274",

language = "English",

volume = "27",

pages = "5057--5066",

journal = "Journal of materials science",

issn = "0022-2461",

publisher = "Springer",

number = "18",

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TY - JOUR

T1 - Surface and grain boundary analysis of doped zirconia ceramics by AES and XPS

AU - Theunissen, G.S.A.M.

AU - Winnubst, A.J.A.

AU - Burggraaf, A.J.

PY - 1992

Y1 - 1992

N2 - The surface- and grain boundary composition of Y, Ce and Ti doped zirconia were studied by X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy/Scanning Auger Microscopy. The grain boundaries and free surfaces showed the same enrichment levels. After heat treatment ge 1000 DaggerC all yttria doped samples showed yttrium enrichment. In the ZrO2-Y2O3 system the yttrium enrichment did not depend on the bulk concentration and amounted 30–34 mol% YO1.5 in all cases. As a consequence the segregation factor increases with decreasing solute concentration in the bulk. The thickness of the segregation layer was about 2–4 nm. In the ternary Y doped systems yttrium is the main segregant. In ceria-doped tetragonal zirconia polycrystals (Ce-TZP) systems significant segregation of cerium starts at T≥1300‡C and is mainly attributed to Ce3+. In Y,Ti-TZP systems also strong segregation of Ti4+ occurs. The absolute value of the increase of the surface concentration in fine grained material is smaller than in coarse grained material. This is mainly due to depletion of the bulk.

AB - The surface- and grain boundary composition of Y, Ce and Ti doped zirconia were studied by X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy/Scanning Auger Microscopy. The grain boundaries and free surfaces showed the same enrichment levels. After heat treatment ge 1000 DaggerC all yttria doped samples showed yttrium enrichment. In the ZrO2-Y2O3 system the yttrium enrichment did not depend on the bulk concentration and amounted 30–34 mol% YO1.5 in all cases. As a consequence the segregation factor increases with decreasing solute concentration in the bulk. The thickness of the segregation layer was about 2–4 nm. In the ternary Y doped systems yttrium is the main segregant. In ceria-doped tetragonal zirconia polycrystals (Ce-TZP) systems significant segregation of cerium starts at T≥1300‡C and is mainly attributed to Ce3+. In Y,Ti-TZP systems also strong segregation of Ti4+ occurs. The absolute value of the increase of the surface concentration in fine grained material is smaller than in coarse grained material. This is mainly due to depletion of the bulk.

U2 - 10.1007/BF01105274

DO - 10.1007/BF01105274

M3 - Article

SN - 0022-2461

VL - 27

SP - 5057

EP - 5066

JO - Journal of materials science

JF - Journal of materials science

IS - 18

ER -

Surface and grain boundary analysis of doped zirconia ceramics by AES and XPS

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