Surface Contamination: A Natural Way toward High-Resolution Electric Force Microscopy in Contact-Resonant Mode

Albert Minj*, Jill Serron, Umberto Celano, Kristof Paredis

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)25331-25340
JournalJournal of physical chemistry C
Volume124
Issue number46
Early online date10 Nov 2020
DOIs
Publication statusPublished - 19 Nov 2020

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