Surface Contamination: A Natural Way toward High-Resolution Electric Force Microscopy in Contact-Resonant Mode

Albert Minj; Jill Serron; Umberto Celano; Kristof Paredis

doi:10.1021/acs.jpcc.0c07639

Surface Contamination: A Natural Way toward High-Resolution Electric Force Microscopy in Contact-Resonant Mode

Albert Minj^*, Jill Serron, Umberto Celano, Kristof Paredis

^*Corresponding author for this work

Research output: Contribution to journal › Article › Academic › peer-review

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Original language	English
Pages (from-to)	25331-25340
Journal	The Journal of physical chemistry C
Volume	124
Issue number	46
Early online date	10 Nov 2020
DOIs	https://doi.org/10.1021/acs.jpcc.0c07639
Publication status	Published - 19 Nov 2020

Keywords

22/2 OA procedure

Access to Document

10.1021/acs.jpcc.0c07639

ArticleFinal published version, 8.61 MBLicence: Taverne

Cite this

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title = "Surface Contamination: A Natural Way toward High-Resolution Electric Force Microscopy in Contact-Resonant Mode",

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