Surface Contamination: A Natural Way toward High-Resolution Electric Force Microscopy in Contact-Resonant Mode

Albert Minj*, Jill Serron, Umberto Celano, Kristof Paredis

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

33 Downloads (Pure)
Original languageEnglish
Pages (from-to)25331-25340
JournalThe Journal of physical chemistry C
Issue number46
Early online date10 Nov 2020
Publication statusPublished - 19 Nov 2020


  • 22/2 OA procedure

Cite this