Surface Contamination: A Natural Way toward High-Resolution Electric Force Microscopy in Contact-Resonant Mode

Albert Minj; Jill Serron; Umberto Celano; Kristof Paredis

doi:10.1021/acs.jpcc.0c07639

Surface Contamination: A Natural Way toward High-Resolution Electric Force Microscopy in Contact-Resonant Mode

Albert Minj^*
, Jill Serron
, Umberto Celano
, Kristof Paredis

^*Corresponding author for this work

Research output: Contribution to journal › Article › Academic › peer-review

2 Citations (Scopus)

144 Downloads (Pure)

Original language	English
Pages (from-to)	25331-25340
Journal	The Journal of physical chemistry C
Volume	124
Issue number	46
Early online date	10 Nov 2020
DOIs	https://doi.org/10.1021/acs.jpcc.0c07639
Publication status	Published - 19 Nov 2020

Keywords

22/2 OA procedure

Access to Document

10.1021/acs.jpcc.0c07639

ArticleFinal published version, 8.61 MBLicence: Taverne

Cite this

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title = "Surface Contamination: A Natural Way toward High-Resolution Electric Force Microscopy in Contact-Resonant Mode",

keywords = "22/2 OA procedure",

author = "Albert Minj and Jill Serron and Umberto Celano and Kristof Paredis",

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AU - Serron, Jill

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AU - Paredis, Kristof

PY - 2020/11/19

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JO - The Journal of physical chemistry C

JF - The Journal of physical chemistry C

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