Surface dynamics of monoatomic steps on Si(001) studied with a high temperature scanning tunneling microscope

H. J.W. Zandvliet; H. B. Elswijk; E. J. van Loenen

doi:10.1016/0039-6028(92)91448-K

Surface dynamics of monoatomic steps on Si(001) studied with a high temperature scanning tunneling microscope

H. J.W. Zandvliet^*, H. B. Elswijk, E. J. van Loenen

^*Corresponding author for this work

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Abstract

A recently developed, thermally stable scanning tunneling microscope (STM) allows the observation of surfaces at elevated temperatures, up to at least 850 K. We used this STM to study the dynamic behaviour of monoatomic steps on vicinal Si(001). Steps are pinned at surface defects. At unpinned positions, kinks in the step edges change on a time scale of seconds at a temperature of 725 K. We deduce a value of 2.0 eV for the kink detachment energy of the free kinks. Images with dimer-row resolution of Si(100) are obtained for temperatures up to 725 K. Above 850 K the images of the surface steps become fuzzy because of their motion during image acquisition.

Original language	English
Pages (from-to)	264-268
Number of pages	5
Journal	Surface science
Volume	272
Issue number	1-3
DOIs	https://doi.org/10.1016/0039-6028(92)91448-K
Publication status	Published - 1992
Externally published	Yes

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abstract = "A recently developed, thermally stable scanning tunneling microscope (STM) allows the observation of surfaces at elevated temperatures, up to at least 850 K. We used this STM to study the dynamic behaviour of monoatomic steps on vicinal Si(001). Steps are pinned at surface defects. At unpinned positions, kinks in the step edges change on a time scale of seconds at a temperature of 725 K. We deduce a value of 2.0 eV for the kink detachment energy of the free kinks. Images with dimer-row resolution of Si(100) are obtained for temperatures up to 725 K. Above 850 K the images of the surface steps become fuzzy because of their motion during image acquisition.",

author = "Zandvliet, {H. J.W.} and Elswijk, {H. B.} and {van Loenen}, {E. J.}",

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AU - Zandvliet, H. J.W.

AU - Elswijk, H. B.

AU - van Loenen, E. J.

PY - 1992

Y1 - 1992

N2 - A recently developed, thermally stable scanning tunneling microscope (STM) allows the observation of surfaces at elevated temperatures, up to at least 850 K. We used this STM to study the dynamic behaviour of monoatomic steps on vicinal Si(001). Steps are pinned at surface defects. At unpinned positions, kinks in the step edges change on a time scale of seconds at a temperature of 725 K. We deduce a value of 2.0 eV for the kink detachment energy of the free kinks. Images with dimer-row resolution of Si(100) are obtained for temperatures up to 725 K. Above 850 K the images of the surface steps become fuzzy because of their motion during image acquisition.

AB - A recently developed, thermally stable scanning tunneling microscope (STM) allows the observation of surfaces at elevated temperatures, up to at least 850 K. We used this STM to study the dynamic behaviour of monoatomic steps on vicinal Si(001). Steps are pinned at surface defects. At unpinned positions, kinks in the step edges change on a time scale of seconds at a temperature of 725 K. We deduce a value of 2.0 eV for the kink detachment energy of the free kinks. Images with dimer-row resolution of Si(100) are obtained for temperatures up to 725 K. Above 850 K the images of the surface steps become fuzzy because of their motion during image acquisition.

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SP - 264

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JO - Surface science

JF - Surface science

IS - 1-3

ER -

Surface dynamics of monoatomic steps on Si(001) studied with a high temperature scanning tunneling microscope

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