Surface ellipsometry of the Si(100)2x1 surface using a full microscopic model

Christianus M.J. Wijers, G.P.M. Poppe, Paul Leonardus de Boeij, H.G. Bekker, D.J. Wentink

Research output: Contribution to conferencePosterOther research output

Original languageUndefined
Pages-
Publication statusPublished - 22 Apr 1993
EventOpening instituut Centrum voor Materialenonderzoek - University of Twente, Enschede, Netherlands
Duration: 22 Apr 199322 Apr 1993

Conference

ConferenceOpening instituut Centrum voor Materialenonderzoek
CountryNetherlands
CityEnschede
Period22/04/9322/04/93

Keywords

  • METIS-133052

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