Surface plasmon propagation near an index step

C.E.H. Berger, Charles E.H. Berger, R.P.H. Kooyman, Jan Greve

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Abstract

Propagation effects of surface plasmons on the surface plasmon microscopy (SPM) image of an area around the edge of a cover layer were studied as a function of the wavelength. A phenomenological model that describes these effects of surface plasmon propagation on the observed reflectance is presented. Theoretical and experimental results for wavelengths ranging from 560 to 660 nm for a 50 nm silver layer with 30 nm thick SiO2 pattern on top were compared and found to agree quite well.
Original languageUndefined
Pages (from-to)183-189
Number of pages7
JournalOptics communications
Volume167
Issue number1-6
DOIs
Publication statusPublished - 1999

Keywords

  • Plasmon propagation
  • Surface plasmon
  • METIS-128408
  • IR-73990
  • Surface plasmon microscopy

Cite this

Berger, C. E. H., Berger, C. E. H., Kooyman, R. P. H., & Greve, J. (1999). Surface plasmon propagation near an index step. Optics communications, 167(1-6), 183-189. https://doi.org/10.1016/S0030-4018(99)00309-0