Surface plasmon propagation near an index step

C.E.H. Berger, Charles E.H. Berger, R.P.H. Kooyman, Jan Greve

Research output: Contribution to journalArticleAcademicpeer-review

17 Citations (Scopus)

Abstract

Propagation effects of surface plasmons on the surface plasmon microscopy (SPM) image of an area around the edge of a cover layer were studied as a function of the wavelength. A phenomenological model that describes these effects of surface plasmon propagation on the observed reflectance is presented. Theoretical and experimental results for wavelengths ranging from 560 to 660 nm for a 50 nm silver layer with 30 nm thick SiO2 pattern on top were compared and found to agree quite well.
Original languageUndefined
Pages (from-to)183-189
Number of pages7
JournalOptics communications
Volume167
Issue number1-6
DOIs
Publication statusPublished - 1999

Keywords

  • Plasmon propagation
  • Surface plasmon
  • METIS-128408
  • IR-73990
  • Surface plasmon microscopy

Cite this

Berger, C. E. H., Berger, C. E. H., Kooyman, R. P. H., & Greve, J. (1999). Surface plasmon propagation near an index step. Optics communications, 167(1-6), 183-189. https://doi.org/10.1016/S0030-4018(99)00309-0
Berger, C.E.H. ; Berger, Charles E.H. ; Kooyman, R.P.H. ; Greve, Jan. / Surface plasmon propagation near an index step. In: Optics communications. 1999 ; Vol. 167, No. 1-6. pp. 183-189.
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Berger, CEH, Berger, CEH, Kooyman, RPH & Greve, J 1999, 'Surface plasmon propagation near an index step' Optics communications, vol. 167, no. 1-6, pp. 183-189. https://doi.org/10.1016/S0030-4018(99)00309-0

Surface plasmon propagation near an index step. / Berger, C.E.H.; Berger, Charles E.H.; Kooyman, R.P.H.; Greve, Jan.

In: Optics communications, Vol. 167, No. 1-6, 1999, p. 183-189.

Research output: Contribution to journalArticleAcademicpeer-review

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AU - Berger, C.E.H.

AU - Berger, Charles E.H.

AU - Kooyman, R.P.H.

AU - Greve, Jan

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AB - Propagation effects of surface plasmons on the surface plasmon microscopy (SPM) image of an area around the edge of a cover layer were studied as a function of the wavelength. A phenomenological model that describes these effects of surface plasmon propagation on the observed reflectance is presented. Theoretical and experimental results for wavelengths ranging from 560 to 660 nm for a 50 nm silver layer with 30 nm thick SiO2 pattern on top were compared and found to agree quite well.

KW - Plasmon propagation

KW - Surface plasmon

KW - METIS-128408

KW - IR-73990

KW - Surface plasmon microscopy

U2 - 10.1016/S0030-4018(99)00309-0

DO - 10.1016/S0030-4018(99)00309-0

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SN - 0030-4018

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