Abstract
Propagation effects of surface plasmons on the surface plasmon microscopy (SPM) image of an area around the edge of a cover layer were studied as a function of the wavelength. A phenomenological model that describes these effects of surface plasmon propagation on the observed reflectance is presented. Theoretical and experimental results for wavelengths ranging from 560 to 660 nm for a 50 nm silver layer with 30 nm thick SiO2 pattern on top were compared and found to agree quite well.
Original language | Undefined |
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Pages (from-to) | 183-189 |
Number of pages | 7 |
Journal | Optics communications |
Volume | 167 |
Issue number | 1-6 |
DOIs | |
Publication status | Published - 1999 |
Keywords
- Plasmon propagation
- Surface plasmon
- METIS-128408
- IR-73990
- Surface plasmon microscopy