Surface plasmon propagation near an index step

C.E.H. Berger, Charles E.H. Berger, R.P.H. Kooyman, Jan Greve

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Propagation effects of surface plasmons on the surface plasmon microscopy (SPM) image of an area around the edge of a cover layer were studied as a function of the wavelength. A phenomenological model that describes these effects of surface plasmon propagation on the observed reflectance is presented. Theoretical and experimental results for wavelengths ranging from 560 to 660 nm for a 50 nm silver layer with 30 nm thick SiO2 pattern on top were compared and found to agree quite well.
Original languageUndefined
Pages (from-to)183-189
Number of pages7
JournalOptics communications
Issue number1-6
Publication statusPublished - 1999


  • Plasmon propagation
  • Surface plasmon
  • METIS-128408
  • IR-73990
  • Surface plasmon microscopy

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