Surface plasmon propagation near an index step

C.E.H. Berger; Charles E.H. Berger; R.P.H. Kooyman; Jan Greve

doi:10.1016/S0030-4018(99)00309-0

Surface plasmon propagation near an index step

C.E.H. Berger, Charles E.H. Berger, R.P.H. Kooyman, Jan Greve

Research output: Contribution to journal › Article › Academic › peer-review

18 Citations (Scopus)

Abstract

Propagation effects of surface plasmons on the surface plasmon microscopy (SPM) image of an area around the edge of a cover layer were studied as a function of the wavelength. A phenomenological model that describes these effects of surface plasmon propagation on the observed reflectance is presented. Theoretical and experimental results for wavelengths ranging from 560 to 660 nm for a 50 nm silver layer with 30 nm thick SiO2 pattern on top were compared and found to agree quite well.

Original language	Undefined
Pages (from-to)	183-189
Number of pages	7
Journal	Optics communications
Volume	167
Issue number	1-6
DOIs	https://doi.org/10.1016/S0030-4018(99)00309-0
Publication status	Published - 1999

Keywords

Plasmon propagation
Surface plasmon
METIS-128408
IR-73990
Surface plasmon microscopy

Access to Document

10.1016/S0030-4018(99)00309-0

Cite this

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title = "Surface plasmon propagation near an index step",

abstract = "Propagation effects of surface plasmons on the surface plasmon microscopy (SPM) image of an area around the edge of a cover layer were studied as a function of the wavelength. A phenomenological model that describes these effects of surface plasmon propagation on the observed reflectance is presented. Theoretical and experimental results for wavelengths ranging from 560 to 660 nm for a 50 nm silver layer with 30 nm thick SiO2 pattern on top were compared and found to agree quite well.",

keywords = "Plasmon propagation, Surface plasmon, METIS-128408, IR-73990, Surface plasmon microscopy",

author = "C.E.H. Berger and Berger, {Charles E.H.} and R.P.H. Kooyman and Jan Greve",

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AU - Berger, C.E.H.

AU - Berger, Charles E.H.

AU - Kooyman, R.P.H.

AU - Greve, Jan

PY - 1999

Y1 - 1999

N2 - Propagation effects of surface plasmons on the surface plasmon microscopy (SPM) image of an area around the edge of a cover layer were studied as a function of the wavelength. A phenomenological model that describes these effects of surface plasmon propagation on the observed reflectance is presented. Theoretical and experimental results for wavelengths ranging from 560 to 660 nm for a 50 nm silver layer with 30 nm thick SiO2 pattern on top were compared and found to agree quite well.

AB - Propagation effects of surface plasmons on the surface plasmon microscopy (SPM) image of an area around the edge of a cover layer were studied as a function of the wavelength. A phenomenological model that describes these effects of surface plasmon propagation on the observed reflectance is presented. Theoretical and experimental results for wavelengths ranging from 560 to 660 nm for a 50 nm silver layer with 30 nm thick SiO2 pattern on top were compared and found to agree quite well.

KW - Plasmon propagation

KW - Surface plasmon

KW - METIS-128408

KW - IR-73990

KW - Surface plasmon microscopy

U2 - 10.1016/S0030-4018(99)00309-0

DO - 10.1016/S0030-4018(99)00309-0

M3 - Article

VL - 167

SP - 183

EP - 189

JO - Optics communications

JF - Optics communications

SN - 0030-4018

IS - 1-6

ER -