Surface structure determination by x-ray standing waves at a free-electron laser

G. Mercurio* (Corresponding Author), Igor A. Makhotkin, Igor Milov, Y. Kim, I. Zaluzhnyy, S. Dziarzhytski, L. Wenthaus, I. Vartanyants, W. Wurth

*Corresponding author for this work

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)
41 Downloads (Pure)

Abstract

We demonstrate the structural sensitivity and accuracy of the standing wave technique at a high repetition rate free-electron laser, FLASH at DESY in Hamburg, by measuring the photoelectron yield from the surface SiO<sub>2</sub> of Mo/Si multilayers. These experiments open up the possibility to obtain unprecedented structural information of adsorbate and surface atoms with picometer spatial accuracy and femtosecond temporal resolution. This technique will substantially contribute to a fundamental understanding of chemical reactions at catalytic surfaces and the structural dynamics of superconductors.
Original languageEnglish
Article number033031
Number of pages13
JournalNew journal of physics
Volume21
Issue number3
DOIs
Publication statusPublished - 28 Mar 2019

Keywords

  • Free-electron lasers
  • Multilayers
  • X-ray standing waves

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