Abstract
We demonstrate the structural sensitivity and accuracy of the standing wave technique at a high repetition rate free-electron laser, FLASH at DESY in Hamburg, by measuring the photoelectron yield from the surface SiO<sub>2</sub> of Mo/Si multilayers. These experiments open up the possibility to obtain unprecedented structural information of adsorbate and surface atoms with picometer spatial accuracy and femtosecond temporal resolution. This technique will substantially contribute to a fundamental understanding of chemical reactions at catalytic surfaces and the structural dynamics of superconductors.
Original language | English |
---|---|
Article number | 033031 |
Number of pages | 13 |
Journal | New journal of physics |
Volume | 21 |
Issue number | 3 |
DOIs | |
Publication status | Published - 28 Mar 2019 |
Keywords
- Free-electron lasers
- Multilayers
- X-ray standing waves