Surface topography of Si0.86Ge0.14 observed by Atomic Force Microscopy

C. Flueraru; D. Dascula; P. Osiceanu; N.F. van Hulst; K.O. van der Werf; C.A.J. Putman; F.B. Segerink; E.F. Schipper

Surface topography of Si0.86Ge0.14 observed by Atomic Force Microscopy

C. Flueraru, D. Dascula, P. Osiceanu, N.F. van Hulst, K.O. van der Werf, C.A.J. Putman, F.B. Segerink, E.F. Schipper

Optical Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Proceedings 17th Annual Semiconductor Conference, CAS 1994
Subtitle of host publication	Tuesday 11 to Saturday 16, October 1994, Sinaia Hotel, Sinaia Romania
Place of Publication	Bucharest
Pages	679-700
Number of pages	22
Publication status	Published - 11 Oct 1994
Event	17th Annual Semiconductor Conference, CAS 1994 - Sinaia, Romania Duration: 11 Oct 1994 → 16 Oct 1994 Conference number: 17

Conference

Conference	17th Annual Semiconductor Conference, CAS 1994
Abbreviated title	CAS
Country/Territory	Romania
City	Sinaia
Period	11/10/94 → 16/10/94

Cite this

@inproceedings{9cb0ede8fb9747bc8a094be2337ae05e,

title = "Surface topography of Si0.86Ge0.14 observed by Atomic Force Microscopy",

author = "C. Flueraru and D. Dascula and P. Osiceanu and {van Hulst}, N.F. and {van der Werf}, K.O. and C.A.J. Putman and F.B. Segerink and E.F. Schipper",

year = "1994",

month = oct,

day = "11",

language = "English",

pages = "679--700",

booktitle = "Proceedings 17th Annual Semiconductor Conference, CAS 1994",

note = "17th Annual Semiconductor Conference, CAS 1994, CAS ; Conference date: 11-10-1994 Through 16-10-1994",

}

Flueraru, C, Dascula, D, Osiceanu, P, van Hulst, NF, van der Werf, KO, Putman, CAJ, Segerink, FB & Schipper, EF 1994, Surface topography of Si0.86Ge0.14 observed by Atomic Force Microscopy. in Proceedings 17th Annual Semiconductor Conference, CAS 1994 : Tuesday 11 to Saturday 16, October 1994, Sinaia Hotel, Sinaia Romania. Bucharest, pp. 679-700, 17th Annual Semiconductor Conference, CAS 1994, Sinaia, Romania, 11/10/94.

Surface topography of Si0.86Ge0.14 observed by Atomic Force Microscopy. / Flueraru, C.; Dascula, D.; Osiceanu, P. et al.
Proceedings 17th Annual Semiconductor Conference, CAS 1994 : Tuesday 11 to Saturday 16, October 1994, Sinaia Hotel, Sinaia Romania. Bucharest, 1994. p. 679-700.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

TY - GEN

T1 - Surface topography of Si0.86Ge0.14 observed by Atomic Force Microscopy

AU - Flueraru, C.

AU - Dascula, D.

AU - Osiceanu, P.

AU - van Hulst, N.F.

AU - van der Werf, K.O.

AU - Putman, C.A.J.

AU - Segerink, F.B.

AU - Schipper, E.F.

N1 - Conference code: 17

PY - 1994/10/11

Y1 - 1994/10/11

M3 - Conference contribution

SP - 679

EP - 700

BT - Proceedings 17th Annual Semiconductor Conference, CAS 1994

CY - Bucharest

T2 - 17th Annual Semiconductor Conference, CAS 1994

Y2 - 11 October 1994 through 16 October 1994

ER -