Surface topography of Si0.86Ge0.14 observed by Atomic Force Microscopy

C. Flueraru, D. Dascula, P. Osiceanu, N.F. van Hulst, K.O. van der Werf, C.A.J. Putman, F.B. Segerink, E.F. Schipper

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Original languageEnglish
Title of host publicationProceedings 17th Annual Semiconductor Conference, CAS 1994
Subtitle of host publicationTuesday 11 to Saturday 16, October 1994, Sinaia Hotel, Sinaia Romania
Place of PublicationBucharest
Number of pages22
Publication statusPublished - 11 Oct 1994
Event17th Annual Semiconductor Conference, CAS 1994 - Sinaia, Romania
Duration: 11 Oct 199416 Oct 1994
Conference number: 17


Conference17th Annual Semiconductor Conference, CAS 1994
Abbreviated titleCAS

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