Synchronous Full-Scan for Asynchronous Handshake Circuits

F.J. te Beest, A. Peeters, Hans G. Kerkhoff, K. van Berkel

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Original languageUndefined
    Title of host publicationProceedings IEEE European Test workshop
    Place of PublicationCorfu, Greece
    PublisherIEEE
    Pages381-387
    Number of pages7
    Publication statusPublished - 2002

    Keywords

    • METIS-207538

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