Synchronous Full-Scan for Asynchronous Handshake Circuits

F.J. te Beest, A. Peeters, K. van Berkel, Hans G. Kerkhoff

    Research output: Contribution to journalArticleAcademicpeer-review

    12 Citations (Scopus)
    Original languageUndefined
    Pages (from-to)397-406
    Number of pages10
    JournalJournal of electronic testing
    Volume19
    Issue number4
    Publication statusPublished - 2003

    Keywords

    • METIS-215128

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