Synchronous Full-Scan for Asynchronous Handshake Circuits

F.J. te Beest, A. Peeters, K. van Berkel, Hans G. Kerkhoff

Research output: Contribution to journal › Article › Academic › peer-review

Original language	Undefined
Pages (from-to)	397-406
Number of pages	10
Journal	Journal of electronic testing
Volume	19
Issue number	4
Publication status	Published - 2003

Keywords

@article{63200f546b734c73a5fc446f66158f1a,

title = "Synchronous Full-Scan for Asynchronous Handshake Circuits",

keywords = "METIS-215128",

author = "{te Beest}, F.J. and A. Peeters and {van Berkel}, K. and Kerkhoff, {Hans G.}",

year = "2003",

language = "Undefined",

volume = "19",

pages = "397--406",

journal = "Journal of electronic testing",

issn = "0923-8174",

publisher = "Springer",

number = "4",

}