Synchronous Full-Scan for Asynchronous Handshake Circuits

F.J. te Beest, A. Peeters, Hans G. Kerkhoff, K. van Berkel

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Original language	Undefined
Title of host publication	Proceedings IEEE European Test workshop
Place of Publication	Corfu, Greece
Publisher	IEEE
Pages	381-387
Number of pages	7
Publication status	Published - 2002

Keywords

@inproceedings{a7e6611d279441f29d921dd416ac046a,

title = "Synchronous Full-Scan for Asynchronous Handshake Circuits",

keywords = "METIS-207538",

author = "\{te Beest\}, F.J. and A. Peeters and Kerkhoff, \{Hans G.\} and \{van Berkel\}, K.",

year = "2002",

language = "Undefined",

pages = "381--387",

booktitle = "Proceedings IEEE European Test workshop",

publisher = "IEEE",

address = "United States",

}