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Tailoring strain in microelectronic devices
T. van Hemert
Research output
:
Thesis
›
PhD Thesis - Research UT, graduation UT
354
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Earth and Planetary Sciences
Strain
100%
Microelectronics
100%
Leakage
100%
Electric Charge
50%
Statics
50%
Consumption
25%
Consumer
25%
Thesis
25%
Drain
25%
Act
25%
Handle
25%
Electron
25%
Sum
25%
Joint (Junction)
25%
Water
25%
Material Science
Devices
100%
Strain
100%
Transistor
100%
Microelectronics
100%
Electronic Circuit
75%
Electronics
25%
Engineering
Integrated Circuit
75%
Electric Charge
50%
Current Flow
25%
Energy Consumer
25%
Electric Power Utilization
25%
Water
25%
Physics
Electric Charge
50%